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A device for testing the service life of a computer keyboard

A life test and computer technology, applied in the computer field, can solve problems such as difficult maintenance and repair, high price, complex structure, etc., and achieve the effects of improving accuracy and stability, reducing labor intensity, and convenient operation

Active Publication Date: 2018-10-16
POWERLEADER COMPUTER SYST CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] A good computer keyboard needs to have a long service life. When a new keyboard product is developed, it is necessary to perform a knock test on the keyboard keys, and perform hundreds of thousands of uninterrupted knocks on the keys. The key life span currently on the market The tester is very expensive, and the structure is complex, and it is difficult to maintain and repair. The existing test method is expensive and difficult to be widely accepted, and it is difficult to control the mechanical movement and handling of the test machine manually.

Method used

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  • A device for testing the service life of a computer keyboard
  • A device for testing the service life of a computer keyboard
  • A device for testing the service life of a computer keyboard

Examples

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Embodiment Construction

[0019] Such as Figure 1-Figure 4 As shown, a computer keyboard service life testing device of the present invention includes a host 8 and a running wheel 81 that is rotatably arranged at the bottom of the host 8. A groove 83 is provided in the bottom surface of the host 8, and a groove 83 is arranged in the groove 83. The top wall communicates with a lifting and falling sliding groove 82 extending upwards. The main engine 8 above the lifting and falling sliding groove 82 is provided with a first conduction cavity 86 extending left and right. The right side of the lifting and falling sliding groove 82 The inner wall communicates with a second conduction chamber 84, and the top of the left inner wall of the lifting and sliding groove 82 communicates with a first guide groove 85, and the top of the first guide groove 85 is connected to the left side of the first conduction chamber 86. The bottom of the extended tail is opposite, and the first guide groove 85 is provided with a f...

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PUM

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Abstract

The invention discloses a device for testing the service life of a computer keyboard, and the device comprises a main unit and a travelling wheel which is rotatingly disposed at the bottom of the mainunit. The bottom surface of the main unit is provided with a groove, and the internal top wall of the groove is provided with a lifting sliding groove in a through manner, wherein the lifting slidinggroove extends upwards. A main unit above the lifting sliding groove is provided with a first conduction cavity which extends left and right. The inner wall of the right side of the lifting sliding groove is provided with a second conduction cavity in a through manner. The top of the inner wall of the left side of the lifting sliding groove is provided with a first guide groove, and the top of the first guide groove is opposite to the bottom of a left extending tail end of the first conduction cavity. The interior of the first guide groove is provided with a first screw rod which extends up and down, and an extending tail end of the top of the first screw rod is cooperatively connected with a first motor. The external surface of the first motor is disposed in the top wall of the first guide groove, and is fixedly connected. The device is simple in structure, is convenient to operate, improves the knocking precision and stability, alleviates the labor intensity of a worker, and reducesthe transportation cost.

Description

technical field [0001] The invention relates to the technical field of computers, in particular to a computer keyboard service life testing device. Background technique [0002] A good computer keyboard needs to have a long service life. When a new keyboard product is developed, it is necessary to perform a knock test on the keyboard keys, and perform hundreds of thousands of uninterrupted knocks on the keys. The key life span currently on the market The price of the tester is very expensive, and the structure is complex, and daily maintenance and repair are difficult. The existing test method is expensive and difficult to be widely accepted, and it is difficult for humans to control the mechanical movement and move the test machine. Contents of the invention [0003] The technical problem to be solved by the present invention is to provide a computer keyboard service life testing device, which can solve the above-mentioned problems in the prior art. [0004] The present ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01M13/00
Inventor 潘育素
Owner POWERLEADER COMPUTER SYST CO LTD
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