Microcontroller with average current measurement circuit using voltage-to-current converters
A technology of current converters and microcontrollers, used in the measurement of electrical variables, amplification control, analog-to-digital converters, etc., can solve problems such as negative power supply of operational amplifiers
Active Publication Date: 2018-01-26
MICROCHIP TECH INC
View PDF8 Cites 0 Cited by
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
refer to figure 2 , signal waveform sampling has been done using an op amp to "integrate under the curve" but requires a high value resistor R (whose size is physically large), the integrated output from the op amp is inverted, and the op amp requires a negative power supply rail
Method used
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View moreImage
Smart Image Click on the blue labels to locate them in the text.
Smart ImageViewing Examples
Examples
Experimental program
Comparison scheme
Effect test
Embodiment Construction
[0019] According to various embodiments of the present invention, an embedded system may include a central processing unit (CPU), a memory, and a plurality of peripheral devices to form a system-on-a-chip or a microcontroller on a chip. According to various embodiments, a current integrator based on a voltage-to-current conversion circuit may be provided within a microcontroller. Various embodiments use a voltage to current converter to convert a noisy and / or complex waveform input signal into a current that is integrated (averaged) into a voltage charge on a sample capacitor over a period of time. The magnitude of said charge Q on the capacitor plates is directly proportional to the potential difference V between said capacitor plates. where C is the constant of proportionality known as the capacitance of the capacitor. If the voltage V and capacitance C are known, then Q can be calculated and used to determine the average current from the value of the charge Q over the peri...
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More PUM
Login to View More Abstract
The average of a complex waveform measured over a time period may be determined by first converting the complex waveform to a voltage, then converting this voltage to a current and using this currentto charge a capacitor. At the end of the measurement time period the voltage charge (sample voltage) on the capacitor may be sampled by a sample and hold circuit associated with an analog-to-digital converter (ADC). Then the voltage charge on the sample capacitor may be removed, e.g., capacitor plates shorted by a dump switch in preparation for the next average of the complex waveform sample measurement cycle. The ADC then converts this sampled voltage charge to a digital representation thereof and a true average of the complex waveform may be determined, e.g., calculated therefrom in combination with the measurement time period.
Description
[0001] Related patent applications [0002] This application claims priority to commonly-owned US Provisional Patent Application No. 62 / 164,316, filed May 20, 2015; which is incorporated herein by reference for all purposes. technical field [0003] The present invention relates to microcontrollers, and in particular to microcontrollers with integrated average current measurement circuitry. Background technique [0004] In SMPS (Switch Mode Power Supply) applications, power supply designers need to measure the average current in the power supply. Figure 1(a) and 1(b) Shows a typical current waveform for a traditional (classical) SMPS topology. The simplest design uses peak current sensing, which is usually implemented using an analog comparator. In this case, the average current is simply half of the peak current (Ipk) (Fig. 1(a)). For applications where the current does not reach zero (Figure 1(b)), two measurements are required to calculate the average current: Imin ...
Claims
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More Application Information
Patent Timeline
Login to View More Patent Type & Authority Applications(China)
IPC IPC(8): H03G3/20H03F3/45H03M1/12H02M3/156H02M1/08G01R19/255G01R19/00
CPCG01R19/003G01R19/255H02M1/08H02M3/156H03F3/45H03F2203/45288H03G3/20H03M1/1245H02M1/0009
Inventor 布赖恩·克里斯詹姆斯·E·巴特林
Owner MICROCHIP TECH INC