Array-type emissivity reference object

An emissivity and reference technology, applied in the field of infrared temperature measurement, can solve the problems of easy damage, different specifications, and can not be reused, and achieve the effect of convenient operation, small and simple, and stable temperature field.

Pending Publication Date: 2018-03-13
CHINA JILIANG UNIV
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the reference materials currently used, such as black tape, have different specifications, cannot be reused, have a short lifespan, and are easily damaged after heating. As emissivity reference materials, their emissivity is unstable.
[0003] At this stage, there are not many reference objects with known emissivity for array emissivity reference objects. The current technology has three shortcomings. One is that the temperature measurement range is not wide enough; the other is that within the working temperature range, the emissivity of the reference object is a fixed value. or area value, which cannot be adjusted continuously; third, most reference objects are asymmetric structures, and their own temperature field is unstable, which affects the accuracy of emissivity measurement

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Array-type emissivity reference object

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0013] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0014] see figure 1 , figure 1 It is a structural schematic diagram of the present invention.

[0015] The array type emissivity reference object includes a rectangular parallelepiped metal base 1, a rectangular groove 2, a rectangular wing 3, and a line of symmetry 4. There are a series of rectangular grooves 2 and rectangular wings 3 on the upper surface of the rectangular parallelepiped metal base 1. The rectangular parallelepiped metal base 1 A line of symmetry 4 exists on the surface.

[0016] Select a rectangular metal base 1 made of pure aluminum metal, with a length, width, and height of...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The present invention relates to an array-type emissivity reference object. The array-type emissivity reference object comprises a cuboid metal substrate, rectangular grooves, rectangular wings and asymmetric line. The upper surface of the cuboid metal substrate is provided with a series of rectangular grooves and rectangular wings, and the surface of the cuboid metal substrate is provided with the symmetric line. The array-type emissivity reference object can be taken as a reference object to provide a wide emissivity interval in the infrared temperature measurement technology and provide continuous selectable surface units, the selectable surface units have a continuous and stable emissivity in a working temperature interval, and the symmetrical structure can make a temperature field tobe more stable; and moreover, the array-type emissivity reference object can be taken as an emissivity reference sample after calibration, is small and simple and convenient to operate.

Description

technical field [0001] The invention relates to the technical field of infrared temperature measurement, in particular to an array emissivity reference object. Background technique [0002] Infrared temperature measurement technology has been widely used in civil and industrial fields. To measure the temperature of an object with an infrared temperature measuring device, it is necessary to know the surface emissivity of the object to be measured. However, it is difficult to determine the surface emissivity of an object, because the surface emissivity depends not only on the type of object material, but also on factors such as the surface condition of the object. In the process of temperature measurement, in order to first determine the surface emissivity, a common auxiliary method is to use an object with known emissivity as a reference. However, currently used reference objects such as black tape have different specifications, cannot be reused, have a short lifespan, and ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01J5/52
CPCG01J5/53
Inventor 李文军王潇楠
Owner CHINA JILIANG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products