Sliding table type emissivity testing device

Abstract

The invention relates to a sliding table emissivity testing device. The sliding table emissivity testing device comprises an X motor, an X axis, an X translation stage, a sample, a Y motor, a Y axis,a Y translation stage and an annular clamp. The X-motor, the X-axis and the X translation table form a whole, which is located at the bottom; the sample is placed on the X translation table. The Y motor, the Y axis, the Y translation table and the ring clamp constitute a whole, which is placed vertically above the X translation table; the ring mouth of the annular clamp is just right above the sample. According to the invention, by designing a sliding table emissivity testing device, a relatively wide emissivity interval can be provided in the technical field of infrared temperature measurement, and a continuous optional surface unit is provided. The optional surface unit has a continuous and stable emittance in the working temperature range, and can also directly obtains the specific emissivity to improve the accuracy of measurement emissivity, The accuracy .is small and simple, and is convenient to operate.

Description

technical field [0001] The invention relates to the field of instruments and meters, in particular to an emissivity testing device. Background technique [0002] As a thermophysical parameter that can characterize the radiation ability of materials, emissivity plays an irreplaceable role in many high-tech fields. On the one hand, accurate emissivity data is closely related to basic research such as infrared technology. On the other hand, the study of emissivity has valuable research value in engineering technology fields such as industry, military affairs and aerospace. [0003] In the process of temperature measurement, in order to first determine the surface emissivity, a common auxiliary method is to use an object with known emissivity as a reference. However, the currently obtained emissivity can only be a single or a few values, and a series of values ​​approximately continuous from 0 to 1 cannot be obtained, and a specific emissivity cannot be directly obtained, whic...

AI Technical Summary

Problems solved by technology

However, the currently obtained emissivity can only be a single or a few values, and a series of values ​​approximately from 0 to 1 cannot be obtained, and a specific emissivity cannot be directly obtained, which is labor-intensive and very inconvenient

[0004] There are not many devices for emissivity testing at this stage. The current technology has three shortcomings. First, the temperature measurement range is not wide enough to approximate from 0 to 1; second, within the working temperature range, the emissivity of the reference object is a fixed value or area The value cannot be adjusted continuously; the third is that the specific emissivity cannot be obtained directly, which affects the accuracy of the emissivity measurement

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