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Crystal oscillator phase noise vibration monitoring device and method

A technology of crystal oscillator and phase noise, applied in the direction of measuring devices, electrical devices, instruments, etc., can solve the problems that cannot truly reflect the working status of the product, and achieve the effect of improving the reliability of the whole machine

Inactive Publication Date: 2018-03-30
BEIJING INST OF RADIO METROLOGY & MEASUREMENT
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] The invention provides a crystal oscillator phase noise vibration monitoring device and method, which realizes the phase noise test under vibration conditions, and solves the problem that the traditional vibration test assessment method cannot truly reflect the working state of the product under the vibration environment

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  • Crystal oscillator phase noise vibration monitoring device and method
  • Crystal oscillator phase noise vibration monitoring device and method
  • Crystal oscillator phase noise vibration monitoring device and method

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Embodiment Construction

[0025] In order to make the purpose, technical solution and advantages of the present application clearer, the technical solution of the present application will be clearly and completely described below in conjunction with specific embodiments of the present application and corresponding drawings. Apparently, the described embodiments are only some of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of this application.

[0026] The technical solutions provided by various embodiments of the present application will be described in detail below in conjunction with the accompanying drawings.

[0027] figure 1 It is a schematic diagram of an embodiment of the external structure of the device of the present invention.

[0028] The embodiment of the present application pr...

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Abstract

The invention provides a crystal oscillator phase noise vibration monitoring device and method and solves the problem that working condition of a product cannot be truly reflected under a vibration environment in a conventional vibration test method. The monitoring device comprises a base, a monitoring plate, a fixation plate and a cover plate. The monitoring plate is clamped between the base andthe fixation plate; the fixation plate is provided with an opening and an electrode; the cover plate covers on the upper surface of the opening and is used for fixing a crystal oscillator; the monitoring plate comprises a movable connector and a printed circuit line; the movable connector is used for installing the crystal oscillator and comprises a power supply end and an oscillation signal output end; and the printed circuit line is used for connecting the oscillation signal output end and the electrode. The invention also discloses a monitoring method. The scheme realizes batch monitoring of phase noise of the crystal oscillators under a dynamic work state.

Description

technical field [0001] The present application relates to the field of electronic circuit testing, in particular to a testing device and method for crystal oscillator phase noise. Background technique [0002] In order to realize the requirements for the crystal oscillator vibration phase noise index, it is necessary to dynamically monitor the crystal oscillator vibration phase noise index. The traditional assessment method for phase noise testing of crystal oscillators is to rigidly fix the crystal components on the test bench with corresponding fixtures, and conduct environmental tests according to the spectral shape, magnitude, time and tolerance specified in the test conditions. The phase noise before and after the test was compared. The traditional vibration fixture only plays a fixed role, and such a test method cannot reflect the actual working state of crystal components in vibration. Therefore, it is impossible to observe the degree of phase noise deterioration of...

Claims

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Application Information

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IPC IPC(8): G01H11/00
CPCG01H11/00
Inventor 睢建平崔巍潘立虎郑文强叶林段友峰李国强哈斯图亚张磊祖娜仇昊
Owner BEIJING INST OF RADIO METROLOGY & MEASUREMENT