A method for dynamic detection and compensation of bright and dark areas

Abstract

The invention provides a surface structured light based dynamic detection and compensation method for a highlight or too-dark area in 3D measurement. The method comprises the following steps of projecting surface structured light, collecting an image, carrying out grid partitioning, setting a grayscale threshold, calculating the percentage of pixels greater or lower than the threshold in a grid area, calculating a highlight or too-dark degree, and adjusting, by compensation, the average grayscale I0 and grayscale modulation I1 of a projection raster image in a corresponding area in the projection raster striped image via phase matching so as to adjust the grayscales of the area, corresponding to the highlight or too-dark area of the collected image, in the projection image. Thus, a cameracan collect the striped image whose grayscale information is effective and phase information is clear, the highlight or too-dark area is eliminated and compensated, more effective areas are obtained,and the measuring precision is improved.

Description

technical field [0001] The present invention relates to a compensation method, and further relates to a method for dynamic detection and compensation of high-brightness and over-dark areas in three-dimensional measurement of surface structured light. Background technique [0002] The 3D reconstruction technology is an extension of the 3D measurement technology. The 3D shape information of the target object is obtained through a certain method, and the 3D profile of the object is reconstructed through a certain algorithm. In recent years, 3D reconstruction technology has been more and more applied in the fields of cultural relics protection, reverse engineering, virtual reality and so on. [0003] The 3D reconstruction technology is divided into contact measurement and non-contact measurement according to whether it is in contact with the measurement object during measurement. Among many 3D reconstruction methods, 3D reconstruction based on structured light has the character...

AI Technical Summary

Problems solved by technology

[0005] Existing problems: In surface structured light measurement, whether the phase distribution information and the geometric model of the phase-coordinate relationship can be accurately obtained will directly affect the accuracy and efficiency of 3D measurement

In actual measurement, due to factors such as local specular reflection or visual occlusion on the surface of the object, the captured photos often appear partially bright or too dark, resulting in the lack of phase information, which greatly affects the measurement accuracy and accuracy.

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