Preparation Method of Electron Backscattered Diffraction Samples of Surface Coatings of Galvanized Sheets
An electron backscattering and sample preparation technology, applied in the field of electron backscatter diffraction sample preparation of galvanized sheet surface coating, can solve the problems of stress-free, unable to effectively guarantee the thickness of the galvanized layer, affecting the electrolysis effect, etc., to avoid corrosion and The effect of stress and improving the success rate of preparation
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Embodiment 1
[0031] A method for preparing a galvanized sheet surface coating electron backscattered diffraction sample, comprising the steps of:
[0032] A) Obtain the sample 1 that can be put into the double-beam system sample chamber to observe by cutting on the galvanized sheet, the galvanized sheet is DX53D+ZF galvanized sheet in the present embodiment, and the thickness of galvanized layer 12 in the galvanized sheet is 8 μm, double-beam system AURIGA double-beam system from ZEISS is used in the sample chamber. The cross-section 2 to be processed of the sample 1 is located at the edge of the sample 1. The cross-section 2 to be processed is cut by a precision cutting machine at a low speed, and the cutting speed is 1mm / min. ;
[0033] B) The sample 1 obtained in step A is cleaned by an ultrasonic cleaner and blown dry;
[0034] C) if figure 1 As shown, the sample 1 processed in step B) is placed on the sample stage 3 of the sample room of the double-beam system, the galvanized layer ...
Embodiment 2
[0042] A method for preparing a galvanized sheet surface coating electron backscattered diffraction sample, comprising the steps of:
[0043] A) Obtain the sample 1 that can be put into the double-beam system sample chamber to observe by cutting on the galvanized sheet, the galvanized sheet is DX53D+ZF galvanized sheet in the present embodiment, and the thickness of galvanized layer 12 in the galvanized sheet is 15μm, double-beam system AURIGA double-beam system from ZEISS is used in the sample room. The cross-section 2 to be processed of the sample 1 is located at the edge of the sample 1. The cross-section 2 to be processed is cut by a precision cutting machine at a low speed, and the cutting speed is 3mm / min. ;
[0044] B) The sample 1 obtained in step A is cleaned by an ultrasonic cleaner and blown dry;
[0045] C) The sample 1 that has been processed in step B) is loaded on the sample stage 3 of the sample room of the double-beam system, the galvanized layer 12 of the sa...
Embodiment 3
[0053] A method for preparing a galvanized sheet surface coating electron backscattered diffraction sample, comprising the steps of:
[0054] A) Obtain the sample 1 that can be put into the double-beam system sample chamber to observe by cutting on the galvanized sheet, the galvanized sheet is DX53D+ZF galvanized sheet in the present embodiment, and the thickness of galvanized layer 12 in the galvanized sheet is 15 μm, double-beam system AURIGA double-beam system from ZEISS is used in the sample chamber, the cross-section 2 to be processed of the sample 1 is located at the edge of the sample 1, and the cross-section 2 to be processed is cut by a precision cutting machine at a low speed, the cutting speed is 2mm / min ;
[0055] B) The sample 1 obtained in step A is cleaned by an ultrasonic cleaner and blown dry;
[0056] C) The sample 1 that has been processed in step B) is loaded on the sample stage 3 of the sample room of the double-beam system, the galvanized layer 12 of the...
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