Ternary content-addressable memory for multi-bit error detection circuits
A technology of circuit and pre-charging circuit, which is applied in the field of ternary content-addressable memory, and can solve problems such as noise, TCAM and its surrounding logic sequence failure, etc.
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[0031] The present invention relates to a ternary content addressable memory (TCAM) circuit, and more particularly to a ternary content addressable memory (TCAM) using a dual-phase precharge circuit for a multi-bit error detection circuit. In a specific embodiment, the present invention relates to a TCAM for a multi-bit error detection circuit that uses a two phase pre-charge (TPP) circuit to reduce overall power consumption.
[0032] In particular embodiments of the present invention, a dual-phase match line (ML) precharge circuit draws an initial amount of current during an early precharge phase to differentiate between a possible match and a multi-bit mismatch. Next, a dual-phase match line (ML) precharge circuit disables current sources for multi-bit mismatches during the late precharge phase to reduce overall power consumption.
[0033] In a specific embodiment of the present invention, a technique using a dual phase match line (ML) precharge circuit is implemented in the...
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