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A control circuit for redundant repair and its redundant repair method

A control circuit and redundancy technology, applied in static memory, instruments, etc., can solve the problem of redundant array waste, and achieve the effect of improving utilization.

Active Publication Date: 2020-09-18
SHANGHAI HUAHONG GRACE SEMICON MFG CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This repair limitation will waste redundant array

Method used

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  • A control circuit for redundant repair and its redundant repair method
  • A control circuit for redundant repair and its redundant repair method
  • A control circuit for redundant repair and its redundant repair method

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Embodiment Construction

[0021] The implementation of the present invention is described below through specific examples and in conjunction with the accompanying drawings, and those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific examples, and various modifications and changes can be made to the details in this specification based on different viewpoints and applications without departing from the spirit of the present invention.

[0022] image 3 It is a structural schematic diagram of a control circuit for redundancy restoration in the present invention. Such as image 3 As shown, the present invention is a control circuit for redundancy repair, which is used to determine the polarity of the high-voltage control signal INNERCELL according to the parity characteristics of the damaged sub-block and the parity charact...

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Abstract

The invention discloses a control circuit used for redundant repair and a redundant repair method thereof. The control circuit determines the polarity of a high-pressure control signal INNERCELL polarity according to the odd-even characteristics of a damaged storage subblock and the odd-even characteristics of a selected redundant subblock. According to the control circuit, restriction during RDNrepair in the prior art can be overcome, and the utilization ratio of the RDN repair is improved.

Description

technical field [0001] The invention relates to the technical field of storage unit redundancy repair, in particular to a control circuit for redundancy repair and a redundancy repair method thereof. Background technique [0002] figure 1 , figure 2 It is a schematic diagram of the redundant array RDN and the main storage array in the prior art. When the first column of the sub-block (sector) corresponding to A7=0 is operated, if the first column of the row CG0<0> is operated, the bit line BL1 <0> applies high voltage and bit line BL0<0> applies low voltage. If the first column of the row CG1<0> is operated, bit line BL1<0> applies low voltage and bit line BL0<0> applies high voltage; while operating A7 = 1 corresponding to the first column of the sub-block (sector), if the first column of the row CG0<1> is operated, the bit line BL1<0> will be low voltage and the bit line BL0<0> will be high voltage, if CG1 is operate...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G11C29/42G11C29/44G11C29/00
CPCG11C29/42G11C29/44G11C29/785
Inventor 胡剑
Owner SHANGHAI HUAHONG GRACE SEMICON MFG CORP