Ion Thruster Lifetime Evaluation Method Based on Gate Corrosion Morphology and Electron Reflow

An ion thruster and life evaluation technology, which is applied in the testing of instruments, machines/structural components, measuring devices, etc., can solve the problems of poor life prediction accuracy and long life evaluation test time of ion thrusters.

Active Publication Date: 2020-07-14
CHINA ACADEMY OF SPACE TECHNOLOGY
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Problems solved by technology

[0005] The technical problem solved by the present invention is: to overcome the deficiencies of the prior art, to provide an ion thruster life evaluation method based on grid corrosion morphology and electron backflow, and to solve the long life evaluation test time of the ion thruster and the accuracy of life prediction poor problem

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  • Ion Thruster Lifetime Evaluation Method Based on Gate Corrosion Morphology and Electron Reflow
  • Ion Thruster Lifetime Evaluation Method Based on Gate Corrosion Morphology and Electron Reflow
  • Ion Thruster Lifetime Evaluation Method Based on Gate Corrosion Morphology and Electron Reflow

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Embodiment Construction

[0060] Aiming at the deficiencies in the prior art, the present invention proposes a method for evaluating the life of an ion thruster based on gate corrosion morphology and electron backflow, including the following steps:

[0061] Step 1, data acquisition of gate corrosion morphology

[0062] First of all, the characteristic quantities representing the corrosion morphology of the ion thruster grid are collected, mainly "corrosion depth of the surface groove downstream of the acceleration grid" and "diameter of the acceleration grid hole". in:

[0063] a) The groove corrosion depth on the downstream surface of the accelerating grid is based on the maximum value of the average groove corrosion depth of the three grid holes in the central area, that is in d ij (t) is the ith (i=1,2,...,nd, n d ≥3) grid hole and the groove corrosion depth of the surrounding jth (j=1,2,...,6) adjacent grid hole (such as figure 1 shown);

[0064] b) The diameter of the acceleration grid ho...

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Abstract

The invention discloses an ion thruster service life evaluating method based on grid corrosion morphology and electronic backflow. The method comprises the steps of firstly collecting the corrosion depth of a groove in the surface of the downstream of an accelerating grid and the diameter of a grid hole of the accelerating grid, building a grid corrosion degradation model, determining grid corrosion degradation model parameters, obtaining a grid corrosion fitting degradation model, then, estimating the service life of an ion thruster, collecting electronic backflow limit voltage data under different testing times, building an electronic backflow limit voltage degradation model, determining grid corrosion degradation model parameters, obtaining a grid corrosion fitting degradation model, estimating the service life of the ion thruster, and finally comprehensively estimating the service life of the ion thruster.

Description

technical field [0001] The invention relates to the technical field of ion thruster life evaluation, in particular to an ion thruster life evaluation method based on grid corrosion morphology and electron backflow. Background technique [0002] The electric propulsion system is an advanced space propulsion system, which has the characteristics of high specific impulse, high efficiency, and low thrust. It can effectively improve the service life and carrying capacity of satellites in orbit. In recent years, it has been more and more widely used in space propulsion. Compared with chemical propulsion, electric propulsion has the outstanding advantage of high specific impulse, which can greatly reduce the amount of propellant carried by satellites, thereby increasing the payload ratio of satellites, prolonging on-orbit life, and reducing launch weight. [0003] Xenon ion thruster is an important member of the electric thruster family, and its specific impulse and efficiency are ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01M99/00G06F30/20G06F119/04
CPCG06F30/20G06F2119/04
Inventor 王宗仁王敏林逢春王珏吴继峰
Owner CHINA ACADEMY OF SPACE TECHNOLOGY
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