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Internet of things testing method and device

A test method and test device technology, applied in network data management, wireless communication, electrical components, etc., can solve problems such as unable to meet access to a large number of terminals

Active Publication Date: 2018-09-25
ZTE CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The method and device for testing the Internet of Things provided by the embodiments of the present invention mainly solve the technical problem that when testing the Internet of Things in the prior art, it is impossible to meet the problem of accessing a large number of terminals under the condition of limited hardware resources of the test equipment.

Method used

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Examples

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Embodiment 1

[0033] In order to solve the problem in the prior art that when testing the Internet of Things, when the test equipment cannot meet the requirements of accessing a large number of terminals, additional hardware resources have to be added to access more terminals for testing, resulting in an increase in testing costs. This embodiment provides An Internet of Things test method. It should be noted that the Internet of Things test method provided in this embodiment can be applied to NB-IoT Internet of Things tests, or can also be applied to other Internet of Things tests that require access to multiple test terminals. For details, please refer to figure 1 shown, including:

[0034] S101: Obtain configuration data of a blank test terminal on a test device and a virtual SIM card to be tested.

[0035] First, the configuration data of the virtual SIM card to be tested in this embodiment is described, each virtual SIM card to be tested in this embodiment has its corresponding configu...

Embodiment 2

[0073] In order to better understand the present invention, this embodiment provides a more specific IoT testing method based on the first embodiment and combines three specific scenarios for further illustration.

[0074] In the first example provided in this embodiment, there are 1000 virtual SIM cards that need to be connected to the NB-IoT Internet of Things for testing, but the test equipment can only provide 500 blank test terminals. In order to make all the 1000 virtual SIM cards Access to the NB-IoT Internet of Things and enable data interaction, see Image 6 As shown, the IoT testing methods provided in this example include:

[0075] S601: Acquiring configuration data of 1000 virtual SIM cards in batches.

[0076] Here it is assumed that the 1000 pieces of configuration data in step S601 are SIM1-SIM1000.

[0077] S602: Acquire 500 blank test terminals on the test device.

[0078] The method for obtaining a blank test terminal in this embodiment can be obtained by ...

Embodiment 3

[0134] This embodiment provides a test device for the Internet of Things, please refer to Figure 9 As shown, include: acquisition module 91, writing module 92, and processing module 93, wherein, acquisition module 91 is used for acquiring the configuration data of the blank test terminal on the test equipment and each virtual SIM card to be tested, and the blank test terminal includes and The circuit resources for realizing the SIM function corresponding to the virtual SIM card to be tested; the writing module 92 is used to write the configuration data of the corresponding virtual SIM card to be tested into the corresponding blank test terminal according to the preset writing rule to form a test terminal with network access and data The effective test terminal of interactive function; The processing module 93 is used to access the Internet of Things to be tested by the effective test terminal, and saves the configuration data and networking configuration information of the vir...

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Abstract

The embodiment of the invention provides an Internet of things testing method and device. The Internet of things testing method comprises the following steps: writing acquired configuration data of avirtual SIM (Subscriber Identity Module) card to be tested into a corresponding blank testing terminal to form a valid testing terminal in order to access Internet of things to be tested; storing theconfiguration data of the virtual SIM card to be tested in the valid testing terminal and networking configuration information in a virtual testing terminal to perform restoration on the blank testingterminal when testing data interaction is performed between the virtual SIM card to be tested and the Internet of things to be tested in order to realize testing data interaction between the valid testing terminal and the Internet of things to be tested, namely, the blank testing terminal only needs to be used by the virtual testing terminal corresponding to the virtual SIM to be tested when testing data interaction is performed between the virtual SIM card to be tested and the Internet of things to be tested. Under other conditions, the corresponding blank testing terminal is in a non-occupied state, so that the blank testing terminal can be used repeatedly. Thus, access of more testing terminals can be realized under the condition of not increasing the hardware cost, and the testing cost is lowered.

Description

technical field [0001] The invention relates to the technical field of wireless communication, in particular to a method and device for testing the Internet of Things. Background technique [0002] NB-IoT (Narrow Band Internet of Things, Narrowband Internet of Things) is one of the many technologies of Low Power Wide Area Network (LowPower Wide Access, LPWA), which can support the cellular data connection of low power consumption devices in the Wide Area Network. [0003] NB-IoT has four major characteristics: first, wide coverage, which can provide improved indoor coverage. Under the same frequency band, NB-IoT has a gain of 20dB compared with the existing network, and the coverage area is expanded by 100 times; second, it has the ability to support massive connections. Ability, a sector of NB-IoT can support 100,000 connections, support low latency sensitivity, ultra-low equipment cost, low power consumption and optimized network architecture; the third is lower power cons...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04W8/18H04W24/06
CPCH04W8/183H04W24/06
Inventor 姚静沈媛王延鹏
Owner ZTE CORP
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