Automatic probe test device and system
A test device and probe technology, applied in the field of probe test, can solve the problems of low test efficiency, few test points, manual movement, etc., and achieve the effect of improving test efficiency, reducing damage probability, and reducing manual movement of the device under test
Pending Publication Date: 2018-10-12
HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
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Problems solved by technology
[0003] The existing probe tester on the market is a single cantilever four-probe tester, which adopts the method of separating the probe from the measurement and control circuit, and only one probe is suitable for single-point testing. When the device is tested at multiple points, it is necessary to manually move the device under test
[0004] It can be seen that the test efficiency of the automatic detection and testing device in the prior art is low, and the artificial movement of the device under test during the test process is likely to cause damage to the device
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[0019] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0020] see figure 1 and Figure 4 As shown, it is a schematic structural view of the automatic probe testing device of the present invention, including: a side plate 1, a bottom plate 2, a probe bracket 3 and a moving mechanism 4, and one end of the bottom of the side plate 1 is connected to one side of the bottom plate 2 , the bottom plate 2 is used to place the device under test, the probe holder 3 is fixedly connected to one end of the moving mechanism, an...
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The present invention discloses an automatic probe test device. The device comprises a side plate, a bottom plate, a probe support and a mobile mechanism. One end of the bottom portion of the side plate is connected with one end of the bottom plate, the bottom plate is configured to put a device to be measured, the probe support is fixedly connected with one end of the mobile mechanism, the otherend of the mobile mechanism is slidingly connected in an axial direction of the side plate; and the probe support is provided with four sets of four-needle probes, each set of four-needle probes at least comprises one four-needle probe which can be transversely and vertically moved on the probe support. Besides, the present invention further provides an automatic probe test system based on the device. According to the invention, the automatic probe test device and system improve the test efficiency of the device to be tested, reduce the manual movement of the device to be tested in the test process and reduce the damaging rate of the device.
Description
technical field [0001] The invention relates to the technical field of probe testing, in particular to an automatic probe testing device and system. Background technique [0002] The probe tester is a multi-purpose comprehensive measuring equipment using the four-probe measurement principle, suitable for use in laboratories or production lines. [0003] The existing probe tester on the market is a single cantilever four-probe tester, which adopts the method of separating the probe from the measurement and control circuit, and only one probe is suitable for single-point testing. When the device is tested at multiple points, it is necessary to manually move the device under test. [0004] It can be seen that the test efficiency of the automatic detection and testing device in the prior art is low, and the artificial movement of the device under test during the test process is likely to cause damage to the device Contents of the invention [0005] The purpose of the embodim...
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IPC IPC(8): G01R27/02
CPCG01R27/02
Inventor 范一松郭强苏锐
Owner HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI