A defect detection device with adaptive backlight
A defect detection and self-adaptive technology, applied in optics, nonlinear optics, instruments, etc., can solve problems such as the inability to clearly display the brightness of the picture and the inability to clearly display the highlights, so as to facilitate deployment, improve detection time, and improve imaging. quality effect
Active Publication Date: 2021-03-16
WUHAN JINGCE ELECTRONICS GRP CO LTD
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Problems solved by technology
Solve the problem that the weak dark spots caused by the overall brightness of the screen cannot be clearly displayed, and the problem that some weak bright spots cannot be clearly displayed due to the overall brightness of the entire screen is too dark
Method used
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Embodiment
[0037] One, at first introduce the main hardware structure of the present invention.
[0038]The whole system includes operating platform, control cabinet, camera (including motion motor) group, and light source group.
[0039] 1. Camera group.
[0040] The camera group includes multiple types of cameras or multiple numbers of cameras according to actual needs. In addition, since the camera needs to perform automatic positioning and focusing during actual use, each camera includes a corresponding motion motor for control.
[0041] 2. Light source group.
[0042] Since some dust and stains on the LCD screen can only be photographed under specific external lighting conditions, a specific light source group is required for supplementary light shooting.
[0043] 3. Backlit platform.
[0044] The thin-film liquid crystal tube itself does not emit light, and the backlight platform is used to provide a stable light source for the thin-film liquid crystal panel. The backlight pla...
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The invention relates to the field of automatic defect detecting for an LCD based on AOI , in particular to the field of automatic detection on some Mura class defects and point class micro defects ofthe LCD, and particularly relates to a defect detecting device with self-adaptation backlight. Different backlight brightness can be set according to different patterns so as to guarantee that defects in each pattern have the optimal manifestation effect. With the defect detecting device, it can be effectively avoided that because of brightness difference of a picture to be detected, the defect manifestation effect is poor; the problems that because the overall brightness of the picture is too high, weak dark spots can not be clearly manifested, and because the overall brightness of the picture is too low, weak bright spots can not be clearly manifested are solved; the relevance ratio and the fall-out ratio of defect detection of the LCD are easily increased.
Description
technical field [0001] The invention relates to the field of automatic detection of LCD defects based on AOI, especially the field of automatic detection of some mura defects and point microscopic defects of LCDs, and specifically relates to an adaptive backlight defect detection device. Background technique [0002] Optical automatic inspection technology is an interdisciplinary application technology of optics, mechanics and electricity, which has been widely used in product quality inspection in various industries. Specifically, it involves [0003] Image optical design: lens design selection, CCD selection analysis, light source and optical path design, etc.; [0004] Machine design and manufacture: mechanism design, modular components, structural testing, precision testing; [0005] System integration technology: overall structure test, imaging and control circuit, finite element analysis, positioning and feedback control, etc.; [0006] Image processing technology: ...
Claims
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IPC IPC(8): G02F1/13
CPCG02F1/1309
Inventor 罗巍巍张胜森
Owner WUHAN JINGCE ELECTRONICS GRP CO LTD