Method, device and equipment for generating connection line of interface test adapter of test system, and storage medium

A test system and adapter technology, which is applied in the direction of instruments, special data processing applications, electrical digital data processing, etc., can solve the problems of heavy manual development workload, difficult targeted modification, and large development workload

Active Publication Date: 2018-11-09
THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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Problems solved by technology

[0013] In this way of developing the connection relationship of the self-test adapter, first of all, it faces the problem of a large workload of manual development; secondly, it is difficult to make targeted modifications after the developm

Method used

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  • Method, device and equipment for generating connection line of interface test adapter of test system, and storage medium
  • Method, device and equipment for generating connection line of interface test adapter of test system, and storage medium
  • Method, device and equipment for generating connection line of interface test adapter of test system, and storage medium

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Embodiment Construction

[0090] The present invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0091] The test system self-inspection adapter connection generation method and device are based on the signal-oriented test system self-inspection adapter connection generation device, including a self-inspection relationship analysis module, a test station connection relationship generation module, a self-inspection adapter connection relationship generation module, and a self-inspection relationship. There are four parts in the export module of the detection adapter connection relationship, such as figure 2 shown.

[0092] Input the document describing the self-inspection relationship (*.txt document, *.doc document, *.docx document or *.xml document) into the self-inspection relationship input module, and by calling the existing API interface, the system can be parsed from the document Internal self-inspection relationship;

[0093] The test stat...

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Abstract

The invention discloses a method, device and equipment for generating a connection line of an interface test adapter of a test system, and a storage medium. A description interface test relationship document is input into an interface test relationship input module, and the interface test relationship in the system can be parsed from the document by calling an existing API interface; an interfacetest relationship distribution verification module can obtain a relationship between a system interface test relationship and a test station port by importing an established ATML model and the systeminterface test relationship; an interface test adapter connection line relationship automatic generation module obtains a connection line relationship between interface test adapter ports through a relationship between the system interface test and the test station port; and an interface test adapter connection line relationship export module exports a connection line relationship between the interface test adapter ports and generates an XML format document. According to the method for generating the connection line of the interface test adapter of the test system provided by the invention, asignal-oriented idea is used to guide the development of the interface test adapter connection line relationship, thereby reducing the development work of system integrators, reducing the system specificity, and enhancing the system reusability.

Description

technical field [0001] The invention relates to the technical field of test systems, in particular to a method for generating a test system self-test adapter connection line, a device and a storage medium. Background technique [0002] The test system self-test refers to a check on the usability of the test system before using the test system to test the DUT. The content of the inspection mainly includes whether the test instruments and switchgear in the test system can work normally, whether the communication between the system control computer and the test instruments is normal, whether the signal connection line is intact, whether the excitation signal output is correct, whether the response signal measurement is accurate, etc. . The normal function of the test system is the prerequisite for accurate testing of the DUT. Therefore, the self-test of the test system is one of the important and indispensable components of the automatic test. Indispensable component. [000...

Claims

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Application Information

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IPC IPC(8): G06F17/50
CPCG06F30/18
Inventor 刘硕刘毅邱田华吴波谭旭陈鹏飞邹德军宋斌
Owner THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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