Ultrasonic probe adapter, ultrasonic testing method and ultrasonic testing system
What is Al technical title?
Al technical title is built by PatSnap Al team. It summarizes the technical point description of the patent document.
A technology of ultrasonic probes and testing methods, applied in the testing of machines/structural components, the analysis of solids using sonic/ultrasonic/infrasonic waves, and the material analysis using sonic/ultrasonic/infrasonic waves, etc., can solve problems such as the need for personnel and time-intensive processing
Active Publication Date: 2020-06-12
VESTAS WIND SYST AS
View PDF5 Cites 0 Cited by
Summary
Abstract
Description
Claims
Application Information
AI Technical Summary
This helps you quickly interpret patents by identifying the three key elements:
Problems solved by technology
Method used
Benefits of technology
Problems solved by technology
In addition, testing toothed assemblies by means of known devices and methods requires a human and time-intensive process, which can only be automated to a limited extent
Method used
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more
Image
Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
Click on the blue label to locate the original text in one second.
Reading with bidirectional positioning of images and text.
Smart Image
Examples
Experimental program
Comparison scheme
Effect test
Embodiment Construction
[0048] figure 1 A schematic side view of an exemplary embodiment of an ultrasound probe adapter 1 according to the invention is shown. The ultrasonic probe adapter 1 includes a base body and a test spline 21 . The substrate is defined by a longitudinal length L, a thickness D and a width B (not shown here). The longitudinal length L of the ultrasound probe adapter 1 extends from the first end 12 to the second end 14 . Orthogonal to the longitudinal length L, the ultrasound probe adapter 1 additionally has a thickness D. The thickness D extends from the probe side 10 to the root diameter 23 of the test toothing 21 . The thickness D varies in dimension along the longitudinal length L such that the concave test specimen side 20 is defined by a width B oriented normal to the thickness D and normal to the longitudinal length L and a root diameter 23 extending generally longitudinally.
[0049] On the test specimen side 20 a test toothing 21 is arranged. The test toothing 21 co...
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more
PUM
Login to view more
Abstract
The present invention relates to an ultrasonic probe adapter for ultrasonic testing of toothed test specimens, an ultrasonic testing method and an ultrasonic testing system for detecting flaws in toothed test specimens. In particular, the present invention relates to an ultrasonic probe adapter (1, 1′) for ultrasonic testing of toothed test specimens, in particular of externally toothed test specimens (100, 100′, 101), comprising a probe side (10, 10′) which preferably faces away from a test specimen (100, 100′, 101) during ultrasonic testing, a test specimen side (20, 20′) which preferably faces a test specimen (100, 100′, 101) during ultrasonic testing, wherein the probe side (10, 0′) and the test specimen side (20, 20′) each have a longitudinal extension (L), a thickness (D) extending from the probe side (10, 10′) to the test specimen side (20, 20′), and a width (B) extending orthogonally to the thickness (D) and orthogonally to the longitudinal extension of the probe side (10, 10′) and / or to the longitudinal extension of the test specimen side (20, 20′), wherein a test toothing (21) is arranged on the test specimen side (20, 20′).
Description
technical field [0001] The present invention relates to an ultrasonic probe adapter for ultrasonic testing of toothed test specimens, an ultrasonic testing method and an ultrasonic testing system for detecting defects in toothed test specimens. Background technique [0002] Ultrasonic testing belongs to the non-destructive testing methods, and ultrasonic testing includes in particular the detection of defects in and / or on materials by means of ultrasound. Using ultrasonic testing as an acoustic method allows components to be tested also in the embedded or non-destructive state. The principle of ultrasonic testing is at least based on the fact that ultrasonic waves emitted by ultrasonic devices propagate at different speeds in different media. [0003] Ultrasonic testing is especially useful for materials with sound-conducting behaviour. Ultrasonic testing is used in particular to detect internal and external flaws in, for example, weld seams, forgings and / or castings. Ult...
Claims
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more
Application Information
Patent Timeline
Application Date:The date an application was filed.
Publication Date:The date a patent or application was officially published.
First Publication Date:The earliest publication date of a patent with the same application number.
Issue Date:Publication date of the patent grant document.
PCT Entry Date:The Entry date of PCT National Phase.
Estimated Expiry Date:The statutory expiry date of a patent right according to the Patent Law, and it is the longest term of protection that the patent right can achieve without the termination of the patent right due to other reasons(Term extension factor has been taken into account ).
Invalid Date:Actual expiry date is based on effective date or publication date of legal transaction data of invalid patent.
Login to view more 
Login to view more