A Two-Dimensional Diffraction Spectrum Compression Storage Method

Abstract

The invention relates to a two-dimensional diffraction pattern compressing and storing method, comprising the following steps: selecting sampling points in a scanning area set by a diffraction experiment, and counting the number of average diffraction peaks on the two-dimensional diffraction spectrum corresponding to the sampling points; compressing and storing the two-dimensional diffraction patterns collected in the scanning region by means of block compression and storage through parallel computing. The method adopted by the invention has the advantages of fast compression storage speed andlossless storage, and can realize the compression storage of the diffraction spectrum data with large volume, so as to save the laboratory operation cost.

Description

technical field [0001] The invention belongs to the technical field of diffraction, and in particular relates to a two-dimensional diffraction spectrum compression storage method. Background technique [0002] The two-dimensional diffraction technique scans the surface of the sample with a small spot X-ray, and collects a two-dimensional diffraction spectrum at each scanning point using a two-dimensional X-ray detector. By analyzing the two-dimensional diffraction spectrum, it is possible to conduct phase identification, orientation analysis, stress measurement, dislocation research, etc. of the sample. By analyzing the results of scanning experiments, two-dimensional research can be carried out on the phase, orientation, stress and defects in the sample plane. Therefore, the two-dimensional diffraction technique is a technique with wide application. [0003] However, the amount of diffraction spectrum data collected by two-dimensional diffraction is much larger than that ...

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Problems solved by technology

[0003] However, the amount of diffraction spectrum data collected by two-dimensional diffraction is much larger than that of traditional laboratory diffraction data

In addition, if two-dimensional diffraction is carried out by surface scanning method, especially the two-dimensional diffraction carried out in the existing synchrotron radiation station, at least thousands of diffraction spectra can be generated in a short time, which puts great pressure on the storage device , and at the same time caused great economic pressure on the experimental organization

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