A high-precision temperature sensor calibration method and circuit

A temperature sensor and calibration circuit technology, used in thermometer testing/calibration, thermometers, instruments, etc., can solve the problem that the test environment is difficult to meet the sensor calibration requirements, reduce test conditions and test costs, and avoid high-precision temperature environments. the effect of demand

Active Publication Date: 2020-09-01
GIANTEC SEMICON LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

If the sensor accuracy requirement is higher than ±1°C, it is difficult for the test environment to meet the calibration requirements of the sensor

Method used

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  • A high-precision temperature sensor calibration method and circuit
  • A high-precision temperature sensor calibration method and circuit
  • A high-precision temperature sensor calibration method and circuit

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Embodiment Construction

[0045] figure 1 Is a structural schematic diagram of the temperature sensor, the bias current I bias1 Flow to the transistor (bipolar tube) Q1 to generate the voltage V BE ; two bias currents I bias1 and I bias2 flow to transistors Q1 and Q2 respectively, generating two V BE , whose difference is ΔV BE .

[0046] The Sigma delta ADC is responsible for V BE and ΔV BE Perform sampling, generate BS signal, and feedback control input sampling; when BS=0, input sampling ΔV BE , when BS=1, the input sample -V BE ; After BS is filtered by a downsampling filter (decimation filter), a quantized digital temperature signal D is finally generated out .

[0047] figure 1 The temperature signal output in can be expressed as

[0048]

[0049] where α is ΔV BE The magnification at sampling time, which is implemented in the sigma delta ADC.

[0050] It can be seen from formula (1) that the error of the output temperature mainly comes from three parameters, namely V BE , ΔV BE ...

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Abstract

The invention relates to a high-accuracy temperature sensor calibration method and circuit. A high-accuracy voltage VIN with an unknown voltage value is introduced from the outside of a chip; and thevoltage VIN, a voltage VBE generated when a bias current Ibias1 flows onto a transistor Q1 in the chip and a voltage difference delta VBE generated when the bias current Ibias1 and Ibias2 respectivelyflow onto the transistors Q1 and Q2 in the chip are respectively connected to input ends of a sigma delta ADC by switches and are controlled whether to be turned on by the switches. The sigma delta ADC is sequentially enabled to sample the delta VBE / -VIN and sample the delta VBE / -VBE; or, the sigma delta ADC is sequentially enabled to sample the VIN / -VBE and sample the delta VBE / -VBE; or, the sigma delta ADC is sequentially enabled to sample the delta VBE / -VIN and sample the VIN / -VBE; and an actual value of the VBE is obtained according to an output digital temperature signal, and the actualvalue is compared with an ideal value of the VBE to obtain an error which needs to be corrected. According to the invention, the error of the temperature signal can be obtained in a case that the temperature is unknown, so as to avoid a case that when a high-accuracy sensor is calibrated, requirements of the high-accuracy temperature environment need to be provided, and reduce testing condition requirements and testing cost.

Description

technical field [0001] The invention relates to the field of integrated circuit design and testing, in particular to a high-precision temperature sensor calibration method and circuit. Background technique [0002] With the continuous improvement of application requirements, the accuracy of temperature sensors is also continuously improved. In the process of manufacturing the temperature sensor, errors will inevitably be introduced due to process factors. In order to ensure the accuracy of temperature detection by the temperature sensor, it is necessary to eliminate or reduce these errors to a sufficiently small range through various methods. A common way to eliminate errors is to perform calibration after the chip is fabricated. Calibration is to obtain the error of the sensor through testing, and then use the circuit to eliminate the error. In order to test the error of the sensor, the sensor needs to work in a sufficiently high-precision temperature environment, that i...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01K15/00
CPCG01K15/00
Inventor 陈珍珍夏天张洪杨清
Owner GIANTEC SEMICON LTD
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