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Focus plane rapid calibration method and device and focus positioning method and device for microscopic imaging system

A technology of microscopic imaging and calibration method, which is applied in the direction of microscope, optics, instrument, etc., can solve the problems of low precision and large error of focusing algorithm, and achieve the effect of reducing cumulative error, reducing error, and simplifying surface equation fitting

Active Publication Date: 2019-01-18
BEIJING LUSTER LIGHTTECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The purpose of this application is to provide a method and device for rapid calibration of the focal plane of a microscopic imaging system, a focus positioning method and a device, so as to solve the problem of low accuracy caused by large errors in existing focus algorithms

Method used

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  • Focus plane rapid calibration method and device and focus positioning method and device for microscopic imaging system
  • Focus plane rapid calibration method and device and focus positioning method and device for microscopic imaging system
  • Focus plane rapid calibration method and device and focus positioning method and device for microscopic imaging system

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Embodiment 1

[0088] For the first step, see figure 2 , move the microscopic imaging system so that the center of the field of view of the microscopic imaging system is aligned with the position of the end point ① of the screen to be tested for image acquisition, and a series of image acquisitions are performed according to a fixed pulse interval, and the definition of each image is calculated to make the image clear The position with the highest resolution is used as the focusing surface. If the highest resolution image is in the first or last image, then enlarge the pulse jump range and re-acquire and calculate until convergence (the highest resolution image is not in the first or last image) Zhang), and record the converged coordinates (x_①, y_①, z_①) as the first point of calibration.

[0089] The second step is to move the microscopic imaging system so that the center of the field of view of the microscopic imaging system is aligned with the end point ② of the screen to be tested for ...

Embodiment 2

[0107] The first step is to obtain the defect coordinates (x, y) of the point to be focused;

[0108] The second step is to determine which plane area (x, y) the focus point (the point mapped by the center of the field of view of the microscopic imaging system at the imaging position of the mobile phone screen) (x, y) belongs to, for example, it belongs to the A plane area;

[0109] In the third step, according to the plane equation of the plane where the focus point is located and the defect coordinates, that is, the defect coordinates (x, y) are substituted into the plane equation of the A plane area, and the z value is calculated, that is, the distance between the focus point and the defect coordinate is determined. The distance of the screen to be detected.

[0110] It can be seen from the above technical solutions that the embodiment of the present application provides a focus positioning method for a microscopic imaging system, which includes obtaining the defect coordin...

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Abstract

The invention discloses a focus plane rapid calibration method and device and a focus positioning method and device for a microscopic imaging system. The calibration method comprises the following steps: selecting four endpoints and center points of a to-be-detected screen as calibration points, and dividing the to-be-detected screen into four plane regions by the calibration points; establishingplane equations of the four plane regions; solving the plane equations to obtain plane equation coefficients. The focusing and positioning method comprises the following steps: acquiring defect coordinates of a to-be-focused point; judging a plane region where the to-be-focused point is located according to the defect coordinates; and determining the distance between the to-be-detected point and the to-be-detected screen according to a plane equation of the plane region where the to-be-detected point is located and the defect coordinates. According to the focus plane rapid calibration method and the focus positioning method for the microscopic imaging system provided by the invention, the screen is divided into four triangular regions, and plane equation fitting is carried out respectively, so that an accumulative error caused by the distance is reduced; due to a triangular plane, the error of each point is reduced to the maximum degree, so that the phenomenon that angles that are notinvolved are very blurry due to the fact that the whole area of a mobile phone screen is used as a plane is avoided, and curved surface equation fitting is also simplified.

Description

technical field [0001] The present application relates to the technical field of screen defect detection, and in particular to a method for quickly calibrating a focus plane of a microscopic imaging system, a focus positioning method and a device. Background technique [0002] With the continuous development of the liquid crystal display (Liquid Crystal Display, LCD) industry, the automation of liquid crystal screen defect detection equipment is getting higher and higher, and the detection accuracy requirements are getting higher and higher, so the microscopic imaging system has become a must. However, the microscopic imaging system has a small depth of field and high precision, and an error of 1mm may lead to blurred imaging. In order to solve the problem of precision, many kinds of autofocus algorithms have appeared in the industry. [0003] At present, there is a method of using the entire LCD screen area as a plane to fit the plane equation. The main method is to use thr...

Claims

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Application Information

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IPC IPC(8): G02B21/36
CPCG02B21/365G02B21/368
Inventor 王太兴姚毅解三霞路建伟马增婷
Owner BEIJING LUSTER LIGHTTECH