Reverse bias test sample protection method and device
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- PRIME REL ELECTRONIC TECH CO LTD
- Publication Date
- 2020-07-28
Smart Images

Figure 1 
Figure 2 
Figure 3
Abstract
Description
technical field
[0001] The invention relates to a method and a device, in particular to a reverse bias test sample protection method and device, belonging to the technical field of reverse bias test protection. Background technique
[0002] HTRB (High Temperature Reverse Bias, high temperature reverse bias test) is an accelerated life test. During the test, specific electrical conditions are applied to the sample to be tested, and then the sample is placed in a high temperature environment at a specific temperature (such as 125°C) for a specific time ( such as 1000 hours). By applying such harsh environment and electrical stress to the device to be tested to investigate whether the characteristics of the sample to be tested will be degraded, thereby judging or evaluating the quality of the sample to be tested.
[0003] h 3 TRB (High Temperature High Humidity Reverse Bias, high temperature and high humidity reverse bias test) is an accelerated life test. During the test, sp...