A cell defect classification method based on unbiased embedding zero-sample learning

A defect classification and sample learning technology, applied in image analysis, computer parts, image data processing, etc., can solve problems such as strong bias, insufficient defect classifier training, and small sample size, and achieve the effect of ensuring classification accuracy.

Inactive Publication Date: 2019-03-15
ZHEJIANG UNIV
View PDF4 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In the battery defect scenario, the main defect categories include pits, single-layer separator damage, separator folds, scratches, tab discounts, glue stains, damaged metal leakage, air bubbles, toner sticks, and toner dirt. There are 13 categories of dirt, crushing, foreign matter, and oil pollution, some of which have a relatively low probability of occurrence, and the corresponding sample size is too small, which is not enough to be directly used for the training of the defect classifier
In addition, some defects are gradually excavated with the classification, and new types of defects will appear
Classification in this case requires a zero-shot learning strategy, but most of the existing zero-shot learning methods suffer from strong bias: during the training phase, the input is usually projected to several parts of the semantic embedding space determined by the source class. fixed point

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A cell defect classification method based on unbiased embedding zero-sample learning
  • A cell defect classification method based on unbiased embedding zero-sample learning
  • A cell defect classification method based on unbiased embedding zero-sample learning

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0024] The technical solution of the present invention is clearly and completely explained and described below.

[0025] The present invention proposes an unbiased embedded zero-sample learning battery defect classification method, which can realize the classification of common defects (source category) and rare defects (target category) for image blocks containing battery defects, including the following steps :

[0026] Step 1, collecting image data of cell defects. The battery cell is photographed by a high-definition camera, and the center point is randomly searched for the part containing defects, and cut into 96×96 image blocks, while ensuring that various defects can still be seen in the image blocks. Mark the cut image blocks as pits, damaged single-layer isolation film, folded isolation film, scratches, folded tabs, glue stains, damaged metal leaks, air bubbles, toner strips, toner dirt, crushing, There are 13 types of cell defect categories including foreign matter...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

A method for classify cell defects base on unbiased embedded zero-sample learning includes such steps as 1) obtaining an image block containing defects with suitable size from a cell picture collectedby a high-definition camera through a sliding window, allocating common defect categories as labeled source data, and allocating rare defect categories as unlabeled target data; 2) end-to-end training of the quasi-fully supervised learning network model QFSL using annotated source class data and unannotated target class data; (3) In the testing phase, the input image block is embedded by the visual embedding subnetwork, and then the image block is embedded by the visual embedding subnetwork, and the image block is embedded by the visual embedding subnetwork. Semantic linking sub-network completes the mapping from visual embedding to semantic embedding, then gets the scores of visual embedding and semantic embedding by inner product calculation, and finally sends them to Softmax classifierto generate the prediction probability of all categories, and takes the category with the highest probability as the classification result.

Description

technical field [0001] The invention belongs to the field of industrial defect identification. Aiming at the problem that the data of some defects in the battery defect classification scene is relatively small or difficult to obtain, a battery defect classification method based on unbiased embedded zero-sample learning is proposed. Background technique [0002] Cell defect identification is an important part of the battery production process. In the modern society with the rapid development of industrialization, the traditional way of using manual inspection has many disadvantages: (1) It is labor-intensive. The method of manually checking for defects requires a lot of manpower and time to match the needs of the battery market; (2) The evaluation lacks objectivity. The manual judgment of defects mainly depends on personal experience, which is difficult to unify for different workers, so the final judgment is relatively subjective; (3) the visual impairment of workers is gre...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G06K9/62G06T7/00
CPCG06T7/0008G06T2207/20081G06T2207/20084G06T2207/30108G06F18/2414G06F18/2431G06F18/214
Inventor 宋明黎雷杰宋杰
Owner ZHEJIANG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products