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Scattering parameter testing system and method

A scattering parameter test and tester technology, which is applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., can solve the problems of low production efficiency and complicated testing process, and achieve the effects of convenient operation, simplified production process and simple testing process.

Pending Publication Date: 2019-03-26
COMBA TELECOM TECH (GUANGZHOU) CO LTD +1
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] Based on this, it is necessary to provide a scattering parameter testing system and method for the traditional scattering testing method, the testing process is complicated, and the production efficiency is extremely low.

Method used

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  • Scattering parameter testing system and method
  • Scattering parameter testing system and method

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Embodiment Construction

[0040] In order to facilitate the understanding of the present application, the present application will be described more fully below with reference to the relevant drawings. A preferred embodiment of the application is shown in the drawings. However, the present application can be embodied in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of this application more thorough and comprehensive.

[0041] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the technical field to which this application belongs. The terms used herein in the specification of the application are only for the purpose of describing specific embodiments, and are not intended to limit the application. As used herein, the term "and / or" includes any and all combinations of one or more of the associa...

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Abstract

The application discloses a scattering parameter testing system and method. The scattering parameter testing system comprises a testing module for connection of a to-be-tested radio frequency module with a tester. The testing module includes a transmission structure, a test connecting member and a short-circuit member; the transmission structure includes a first connecting portion, a second connecting portion, and a test circuit connected between the first connecting portion and the second connecting portion; a first end of the test connecting member is connected to the first connecting portion and a second end is connected with the tester; one end of the short-circuit is connected to the second connecting portion; and one end of the to-be-tested radio frequency module is connected to thefirst connecting portion and the other end is connected with the tester. Therefore, scattering parameters of each radio-frequency module in the integrated product can be tested conveniently and rapidly; making and usage of special-purpose testing tools of all to-be-tested modules are avoided and independent and advanced testing of parameters of all to-be-tested modules is not required, and then all to-be-tested modules are assembled and welded together; the production process is simplified substantially; and the test process is simple, the system and method are easy to operate, and thus the production efficiency is improved.

Description

technical field [0001] The invention relates to the technical field of radio frequency testing, in particular to a scattering parameter testing system and method. Background technique [0002] In traditional mobile communication equipment, the input and output terminals of each radio frequency module are usually provided with radio frequency connectors, and the respective scattering parameters (scattering parameters, also called S parameters) can be tested separately before the connection of each radio frequency module; however, with With the development of mobile communication, especially 5G communication systems, each radio frequency module in communication equipment is gradually evolving towards miniaturization and integration. A typical solution is that the filter module and antenna module are integrated, and the filter module and antenna There is no radio frequency connector between the modules; the traditional test method is used to carry out the scattering test on the...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R27/28G01R31/00
CPCG01R27/28G01R31/00
Inventor 李明超苏国生
Owner COMBA TELECOM TECH (GUANGZHOU) CO LTD
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