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Post-test simulation fault diagnosis method based on genetic algorithm

A technology of fault diagnosis and genetic algorithm, applied in analog circuit testing, electronic circuit testing, etc.

Active Publication Date: 2019-04-05
UNIV OF ELECTRONIC SCI & TECH OF CHINA +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

The advantage of this method is that the fault diagnosis is faster, but the disadvantage is also obvious, that is, when constructing the dictionary, it is necessary to enumerate all faults

Method used

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  • Post-test simulation fault diagnosis method based on genetic algorithm
  • Post-test simulation fault diagnosis method based on genetic algorithm
  • Post-test simulation fault diagnosis method based on genetic algorithm

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Embodiment

[0046] In order to better illustrate the technical solution of the present invention, the present invention will be described in detail by taking a second-order Thomas analog filter circuit as an example. figure 2 is the topological diagram of the second-order Thomas analog filter circuit in this embodiment. Such as figure 2 As shown, the second-order Thomas analog filter circuit of this embodiment includes 3 amplifiers, 6 resistors and 2 capacitors, and the first resistor R 1 The input of the amplifier is taken as the input of the whole circuit, and the output of the third amplifier is taken as the output of the whole circuit, which is the measuring point t. figure 2 The transfer function of the circuit shown is given by:

[0047]

[0048] where ω represents the angular frequency.

[0049] According to the symbolic analysis method and the transfer function, the fuzzy group situation of this circuit is: {R 1}, {R 2}, {R 4 , R 5 , R 6 ,C 2}, {R 3 ,C 1}. The fa...

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Abstract

The present invention discloses a post-test simulation fault diagnosis method based on a genetic algorithm. The method is characterized in that: an output voltage of an analog circuit at the measurement point under different frequency excitation signals is obtained after measurement; a transmission function and fuzzy groups of the analog circuit are obtained after analysis; each fuzzy group selects a representative fault component; when the population is initialized, each representative fault component corresponds to one sub-population; parameters of the representative fault components take values within the fault range of the corresponding sub-population individuals, and other fault components take values within the tolerance range; for each iteration, each sub-population is first crossedand mutated to generate child populations, and after the child populations are combined with the parent population, the next-generation population is preferably obtained according to the objective function value; and the representative fault component in the optimal individual of the last-generation population with the parameter value within the fault range is a fault diagnosis result. Accordingto the method provided by the present invention, the accuracy of fault diagnosis can be effectively improved.

Description

technical field [0001] The invention belongs to the technical field of analog circuit fault diagnosis, and more specifically relates to a post-test simulation fault diagnosis method based on a genetic algorithm. Background technique [0002] At present, in the field of analog circuit fault diagnosis, there are mainly pre-test simulation (such as fault dictionary method) and post-test simulation methods. The pre-test simulation is to simulate the possible faults of the circuit according to the circuit diagram and parameters before the test, and store the fault response. When the circuit fails, use the same stimulus used to build the dictionary before to measure the fault response. Then look up the closest response from the dictionary to find the fault. The advantage of this method is that the fault diagnosis speed is faster, but the disadvantage is also obvious, that is, when constructing a dictionary, all faults need to be enumerated. Contents of the invention [0003] T...

Claims

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Application Information

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IPC IPC(8): G01R31/316
CPCG01R31/316
Inventor 杨成林胡聪
Owner UNIV OF ELECTRONIC SCI & TECH OF CHINA
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