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A Method of Determining Flash Elements of Infrared Detector Based on LSTM Model

An infrared detector and model technology, which is applied in the field of infrared detection, can solve the problems of misjudging the point target as a flash element, and it is difficult to detect the flash element, and achieves the effect of wide application and improved image quality.

Active Publication Date: 2020-06-26
SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Because flash elements are random in time and space, and are affected by the working environment, it is difficult to detect flash elements based on radiometric calibration.
For weak point targets and their complex environments, the scene-based flash element detection method is easy to misjudge point targets as flash elements

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  • A Method of Determining Flash Elements of Infrared Detector Based on LSTM Model
  • A Method of Determining Flash Elements of Infrared Detector Based on LSTM Model
  • A Method of Determining Flash Elements of Infrared Detector Based on LSTM Model

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Embodiment Construction

[0026] The basic idea of ​​the present invention is to further describe the present invention in conjunction with the accompanying drawings and embodiments below.

[0027] The invention uses a large amount of ground calibration data to determine the position of the flash element in the detector by using the LSTM model, and effectively reduces the influence of the flash element in the infrared image on target detection, identification and positioning.

[0028] Let's take a 256×312 mid-wave infrared detection as an example to illustrate.

[0029] Step 1: Collect the scene data obtained by an infrared detector within a certain period of time, and record the detector and environmental parameters;

[0030] Step 2: After performing non-uniform correction on the infrared image, use the three-gradient threshold method to detect flash elements in the image, compare the real scene, and manually correct the misjudged flash elements;

[0031] Step 3: According to the flash metadata obtai...

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Abstract

The invention relates to a method for determining a flash element of an infrared detector based on an LSTM model. The method comprises the steps of: inputting an image time series and acquiring a flash element at a certain moment by using a preset flash element determination criterion; according to a true scene, determining whether a detection result has a false target determination problem and correcting the flash element manually to obtain a flash element position in the detector at the time; constructing a flash element data set of the infrared detector by using parameters like the detectorfocal plane temperature, integration time, space irradiation, dark current, stress and the like and the marked flash element position and normalizing the data in a data set; and carrying out modelingon data in a training set by an LSTM and determining the flash element position of the infrared detector at any time. The method can be applied to the fields of detector image quality detection and target detection and recognition.

Description

technical field [0001] The invention belongs to the field of infrared detection, and in particular relates to a method for determining flash elements of an infrared detector based on an LSTM model. Background technique [0002] In the infrared detector, due to the influence or limitation of materials, processes, and working environment, some pixels respond too high or too low during imaging, which is called blind pixels. For the pixel whose response characteristic is blind in the service period, it is called fixed blind pixel. A flash cell is defined as a pixel whose probability of a blind cell is less than 100% within a service life. After the infrared image has been corrected non-uniformly, there is still noise caused by flash elements, which has a serious impact on target detection, recognition, and positioning. [0003] At present, there have been many researches on blind element detection of infrared detectors, which are divided into two detection methods based on rad...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01V8/10G01V13/00
Inventor 陈凡胜孙胜利于清华林长青
Owner SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI