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A micro-anechoic chamber for microwave inverse scattering imaging and measurement

An inverse scattering and darkroom technology, applied in the field of micro-darkrooms, can solve the problems of large occupied area of ​​the device, unfavorable use, harsh experimental conditions, etc., and achieve the effect of improving quality and reducing morbidity

Active Publication Date: 2020-08-14
ZHEJIANG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, if you want to use the above measurement devices to achieve better measurement results, the scattering of the external environment must be as small as possible, so the measurement area must be sufficiently open or the measurement device should be placed in a dark room for measurement, resulting in a large area occupied by the device and harsh experimental conditions. Good for use in fields such as biomedical imaging

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  • A micro-anechoic chamber for microwave inverse scattering imaging and measurement
  • A micro-anechoic chamber for microwave inverse scattering imaging and measurement
  • A micro-anechoic chamber for microwave inverse scattering imaging and measurement

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Embodiment Construction

[0039] The implementation process of the present invention will be described in detail below in conjunction with the drawings in the embodiments of the present invention.

[0040] The invention includes a method of constructing a miniature darkroom for microwave inverse scattering imaging and measurement.

[0041] Such as figure 1 As shown, the specific implementation of the present invention includes a horizontal turntable 1, a support column 2 and a darkroom, a scatterer 7 is placed on the top of the support column 2, and the support column 2 made of foam is placed on the horizontal turntable 1, and the horizontal turntable 1 can drive the support column 2 The rotation further drives the scatterer 7 to rotate around its own central axis. A semi-closed darkroom is arranged around the scatterer 7, specifically a cylindrical darkroom. The central axis of the cylindrical darkroom coincides with the rotation axis of the scatterer 7. The artificial surface 3 is composed of a plur...

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Abstract

The invention discloses a miniature darkroom for microwave inverse scattering imaging and measuring. A closed or semi-closed darkroom is arranged around a scattering body and is composed of a double angle absorption artificial surface and a plurality of antennas; the double angle absorption artificial surface is composed of a plurality of wave absorption units; each wave absorption unit comprisesa grounded metal layer, two metal patterns, and an intermediate layer media panel; the metal patterns are located on the upper surface of the intermediate layer media panel; the intermediate layer media panel is located on the upper surface of the grounded metal layer; the metal patterns face inside, and the grounded metal layer faces outside; the antennas comprise a plurality of receiving antennas and a transmitting antenna; and the two metal patterns are configured according to the incidence angle between the position where the wave absorption units are located and the transmitting antenna,and the vertical incidence angle between the position where the wave absorption units are located and the scattering body. According to the miniature darkroom for microwave inverse scattering imagingand measuring, the invention can design and construct an imaging and measuring device with any desired scale, and the overall scale thereof can be as small as the wavelength level, thereby effectivelyreducing the inverse imaging problem and the ill-condition of measuring, and improving the quality of imaging and measurement.

Description

technical field [0001] The invention relates to a miniature electromagnetic wave darkroom, in particular to a miniature darkroom for microwave inverse scattering imaging and measurement. Background technique [0002] The electromagnetic inverse scattering imaging problem refers to the problem of solving information such as the position, shape, and material properties of the scatterer when the distribution of the incident field and the scattered field is known. Microwave imaging has the characteristics of safety, non-contact, and low cost, so it is widely used in military and civilian fields such as security inspection, partition monitoring, and medical imaging. Although the electromagnetic inverse scattering problem has a very wide application prospect, because the electromagnetic inverse scattering problem is an ill-conditioned nonlinear problem, its solution is very difficult. A big difficulty affecting its solution accuracy is the fast and accurate measurement of the amp...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N22/00
Inventor 彭甜冉立新
Owner ZHEJIANG UNIV