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A multi-channel probe

A multi-channel, probe technology, applied in the direction of instruments, measuring devices, measuring electronics, etc., can solve the problems of large board space, unfavorable miniaturization, etc., and achieve the effect of low cost

Active Publication Date: 2021-08-17
ELECTRIC CONNECTOR TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The corresponding configuration requirements of these connectors are miniaturization and high density. However, when performing high-frequency index performance testing on RF circuits, if using existing probes to confirm RF circuits inserted into such board-end connectors, it will be necessary Larger board space is not conducive to miniaturization. In addition, it is impossible to complete the detection of all RF loops synchronously at one time.

Method used

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  • A multi-channel probe
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specific Embodiment approach

[0050] Such as Figure 1 to Figure 3 As shown, a multi-channel probe 100 in a preferred embodiment of the present invention is fitted and connected with a counterpart connector 200 installed on a printed circuit board of an electronic component as an object of measurement (the fitting direction is as follows: figure 1 shown), so that multiple high-frequency signals can be synchronously transferred from the tested printed circuit board to multiple cables, and connected to the detection equipment through the cables, so that the measured object can be accurately measured The detection purpose of multi-channel high-frequency characteristics.

[0051] The fitting connection mode between the probe 100 and its counterpart connector 200 can be referred to as shown in FIG. 4(a) and FIG. 4(b). On the opposite terminal 201 of the opposite connector 200 (refer to FIG. 4(b)), at the same time, the outer metal shielding (including the post, the conductive shell, etc.) around the contact po...

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Abstract

The invention discloses a multi-channel probe, which comprises a post, a main body, a plurality of conductive terminals, a conductive shell, a plurality of cables with coaxial joints, a circuit board, a flange body and a spring. The main body is fixedly provided with a plurality of conductive terminals, which are inserted into the post; one end of the conductive housing is fixed to the post, and the other end is provided with a stopper for the post to move along the mating direction. The movable sleeve part; the circuit board is provided with a plurality of lines to electrically connect the conductive terminal with the corresponding cable, and is inserted into the main body through one end; the flange body is used to install and fix on the The detection fixture is installed on the outside of the conductive shell through its through hole; the spring is installed between the post and the flange body and is located around the outside of the conductive shell and faces away from the conductive shell. The force is exerted on the post in the direction of the flange body; thereby, the present invention can realize the multi-channel probe of the electronic component as the measurement object relative to the circuit board at low cost.

Description

technical field [0001] The invention relates to a probe used for the determination of electronic components, especially for the test occasion of multi-channel signals. Background technique [0002] With the promotion of 5G applications and the gradual maturity of technology, communication terminals that can handle multiple frequencies are mainly used in communication systems, and multiple RF channels are required to perform signal transmission and other processing actions. Therefore, a corresponding number of devices connected to corresponding modules are arranged. Board connectors mounted on circuit boards. The corresponding configuration requirements of these connectors are miniaturization and high density. However, when performing high-frequency index performance testing on RF circuits, if using existing probes to confirm RF circuits inserted into such board-end connectors, it will be necessary Larger board space is not conducive to miniaturization. In addition, it is im...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R1/067
Inventor 赵善记
Owner ELECTRIC CONNECTOR TECH
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