In-machine test method, test device, and terminal equipment and storage medium

A testing method and testing equipment technology, applied in the testing field, can solve problems such as long development cycle, low reliability, and high cost, and achieve the effects of improving performance, improving reliability, and reducing production costs

Active Publication Date: 2021-03-19
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] However, the systematic tests currently used are all tested by external equipment test systems. The above-mentioned technical solutions have technical problems such as high cost, long development cycle, and low reliability.

Method used

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  • In-machine test method, test device, and terminal equipment and storage medium
  • In-machine test method, test device, and terminal equipment and storage medium
  • In-machine test method, test device, and terminal equipment and storage medium

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Embodiment Construction

[0031] In the following description, specific details such as specific system structures and technologies are presented for the purpose of illustration rather than limitation, so as to thoroughly understand the embodiments of the present application. It will be apparent, however, to one skilled in the art that the present application may be practiced in other embodiments without these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present application with unnecessary detail.

[0032] In order to illustrate the technical solutions described in this application, specific examples are used below to illustrate. In this embodiment, the application of the in-machine test method in the terminal equipment photoelectric theodolite is taken as an example for introduction. as attached figure 1 As shown, when implementing S11 to detect the running state of the equip...

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Abstract

This application is applicable to the technical field of in-machine testing, and provides in-machine testing methods, testing devices, terminal equipment, and storage media, including: detecting the operating status of the equipment; feedback signals based on the detected operating status, and equipment preset The characteristic parameters are compared and analyzed to determine whether it is normal; when it is judged to be a fault, the preset fault mode is output, and the fault is isolated for the fault mode; when it is judged to be normal, the detection of the next equipment operation status will be performed sequentially. This application adopts the internal test, does not need to use external equipment, and runs the above test method through the internal processor, so that the system test design can be developed in parallel during system development, which is beneficial to reduce costs; shorten the development cycle; improve the performance of the whole machine ; the reliability of an efficient system.

Description

technical field [0001] The present application belongs to the technical field of testing, and in particular relates to an in-machine testing method, a testing device, terminal equipment and a storage medium. Background technique [0002] Photoelectric tracking equipment is mainly composed of tracking turntable, servo control system, visible imaging tracker, infrared imaging tracker, angle measurement system, main control system, timing positioning equipment, orientation equipment, power distribution management system, etc. With the improvement of the performance and complexity of the vehicle-mounted optoelectronic tracking equipment, it is urgent to carry out system test design in parallel with the system design, so as to improve the fault diagnosis and isolation level of the vehicle-mounted optoelectronic tracking equipment. [0003] However, the systematic tests currently adopted all use external equipment test systems for testing, and the above-mentioned technical solutio...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/22
Inventor 王鹤淇薛乐堂王伟国姜润强刘阳刘廷霞杜璧秀
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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