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Test system and method

A test system and test method technology, applied in the field of electronic information, can solve the problems of test efficiency decline, large energy consumption, and increased energy consumption, and achieve the effect of improving test efficiency

Active Publication Date: 2019-05-21
SHINRY TECH
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Problems solved by technology

[0002] In the production of electronic products, in order to test the reliability of products and screen out defective products, aging methods are often used to test electronic products, that is, to let electronic products run for a long time at high temperature with load, so that electronic equipment ages, usually The aging method used below is to make each electronic product run with a fixed load, so as to realize the aging of the electronic product, so when testing the electronic equipment and aging the electronic equipment, more load equipment is required, which will reduce the The test efficiency of electronic products will consume a lot of energy, especially when the number of electronic products in a certain production batch is large, due to the large number of aging of the production batch, it will lead to a decline in test efficiency and increase energy consumption

Method used

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Embodiment Construction

[0030] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are some of the embodiments of the present invention, but not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0031] see figure 1 , is a schematic structural diagram of a test system provided by an embodiment of the present invention, such as figure 1 As shown, the test system may include: N devices to be tested 101 , one load 102 and one power supply 103 .

[0032] Wherein, the N devices to be tested 101 are connected in series, one end of the N devices to be tested in series is connected to the load 102, and the other end is connected to the power supp...

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Abstract

A test system and method are provided, wherein the system comprises a power supply device (103), N devices to be tested (101) and a load (102). The N devices to be tested (101) are connected in series. One end of the N devices to be tested (101) connected in series is connected to the load (102), and the other end is connected to the power supply device (103), wherein N is an integer greater thanor equal to 2. The devices, in the odd number positions, of the N devices to be tested (101) are in a first working mode, and the devices, in the even number positions, of the N devices to be tested (101) are in a second working mode, which can improve the testing efficiency of the devices to be tested.

Description

technical field [0001] The invention relates to the technical field of electronic information, in particular to a test system and method. Background technique [0002] In the production of electronic products, in order to test the reliability of products and screen out defective products, aging methods are often used to test electronic products, that is, to let electronic products run for a long time at high temperature with load, so that electronic equipment ages, usually The aging method used below is to make each electronic product run with a fixed load, so as to realize the aging of the electronic product, so when testing the electronic equipment and aging the electronic equipment, more load equipment is required, which will reduce the The test efficiency of electronic products will consume a lot of energy, especially when the number of electronic products in a certain production batch is large, due to the large number of aging of the production batch, it will lead to a ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00
CPCG01R31/00
Inventor 张辉陈晓斌
Owner SHINRY TECH
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