High temperature multi-region spectral emissivity measurement system for opaque materials

A technology of spectral emissivity and transparent materials, applied in the field of thermophysical property measurement equipment for opaque materials, can solve the problem of inability to obtain spectral emissivity, and achieve the effect of simple overall structure design, easy comparison, and uniform heat dissipation

Active Publication Date: 2022-02-18
NANJING UNIV OF SCI & TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Since the existing device cannot move the sample during measurement, it is impossible to obtain the spectral emissivity of accurately detecting different regions under the same heating condition

Method used

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  • High temperature multi-region spectral emissivity measurement system for opaque materials
  • High temperature multi-region spectral emissivity measurement system for opaque materials
  • High temperature multi-region spectral emissivity measurement system for opaque materials

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Embodiment

[0049] A graphene film with a thickness of 25 μm was selected as the test sample, the sample size was 50mm×50mm, the heating range was 100-450°C, and the measured spectrum range was 2.5-20 μm. The measurement steps are as follows:

[0050] Step 1: Turn the mirror surface of the rotatable 90° second off-axis parabolic mirror 14 towards the entrance of the standard blackbody radiation source 2, turn on the Fourier infrared spectrometer 1, call out the internal calibration laser of the Fourier transform infrared spectrometer 1, and adjust the conversion optical path 4 Make the optical path coaxial, move the position of the standard blackbody radiation source 2, so that the calibration laser can focus on the entrance center of the standard blackbody radiation source 2;

[0051] Step 2: Connect the digital PID controller 3 to the standard blackbody radiation source 2 and turn it on, set the heating temperature on the digital PID controller 3, and increase it at intervals of 50°C fr...

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Abstract

The invention discloses a high-temperature multi-region spectral emissivity measurement system for opaque materials, which includes a Fourier transform infrared spectrometer (1), a standard blackbody radiation source (2), a digital PID controller (3), a conversion optical path (4), and a data collector (8), computer terminal (9, 10); the control end of the standard blackbody radiation source (2) is connected with a digital PID controller (3), and the standard blackbody radiation source (2) is connected to the measured opaque The materials are respectively located on both sides of the conversion optical path (4), and the Fourier transform infrared spectrometer (1) is connected to the measured opaque material or the standard black body radiation source (2) through the optical signal through the conversion optical path (4), and the measured opaque material Place on a heating platform (6) that is adjustable in height and horizontal position. The spectral emissivity measuring system of the invention can accurately measure the spectral emissivity of different positions of opaque material samples with a large surface size under high temperature conditions, and has a simple structure and high measurement accuracy.

Description

technical field [0001] The invention belongs to the technical field of thermophysical property measurement equipment for opaque materials, in particular to a high-temperature multi-region spectral emissivity measurement system for opaque materials with simple structure and high measurement accuracy. Background technique [0002] The definition of the spectral emissivity of an actual object is the ratio of the spectral radiation intensity of a thermal radiator to that of a black body at the same temperature. The spectral emissivity of a material surface is a physical quantity that characterizes the radiative power of a material surface, and is an extremely important thermophysical parameter. Opaque materials are more common in daily life, such as graphite and some metal materials, to study the spectral emissivity of its surface under different temperature conditions, for its thermal radiation dissipation in practical applications, the study of surface structure, the compositi...

Claims

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Application Information

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Patent Type & AuthorityPatents(China)
IPC IPC(8): G01N25/00
Inventor谭洪冀晨曦
OwnerNANJING UNIV OF SCI & TECH