Software defect prediction method based on principal component analysis and combined sampling
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- YANSHAN UNIV
- Publication Date
- 2019-06-25
- Estimated Expiration
- Not applicable · inactive patent
Smart Images

Figure 1 
Figure 2
Abstract
Description
technical field
[0001] The invention relates to a defect prediction method, in particular to a software defect prediction method based on principal component analysis and combined sampling. Background technique
[0002] With the development of Internet technology, the reliability of software product quality has become a concern in the field of software engineering, and software defects will inevitably appear in the process of software development. However, for software with potential threats, once it is put into use, it will cause huge economic losses to companies and individuals. In order to effectively solve this problem, it is necessary to accurately and quickly predict the possible defect modules of the software, so as to improve the reliability of the software system.
[0003] Currently, related software defect prediction methods mainly utilize different types of machine learning techniques. Its main consideration is the prediction accuracy of the overall data. Althou...