Pathological slice scanning image analysis system and scanning method thereof

A pathological slice and analysis system technology, applied in the field of medical test equipment, can solve problems such as inaccurate focus, complex structure, defocusing, etc., and achieve the effect of reducing maintenance costs, reducing stability requirements, and compact structure

Active Publication Date: 2022-04-01
广州英特美迪科技有限公司 +1
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Most of the existing slide scanning systems use a microscope with a magnification of 20 to 40 times. The depth of field of a microscope with a 20 times magnification is generally between 1 micron and 1.4 microns depending on the brand. Because the surface of the slice is often rough and not Smooth, so that the near part of the image in the field of view observed by the objective lens is clear, but the far part is blurred. Therefore, in the process of slice scanning, due to the complicated structure of the mechanical focusing method of the microscope, the movement accuracy of the stage is limited by the mechanism, which cannot meet the requirements. The requirement of fast focusing may easily lead to inaccurate focusing and out-of-focus phenomena

Method used

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  • Pathological slice scanning image analysis system and scanning method thereof
  • Pathological slice scanning image analysis system and scanning method thereof
  • Pathological slice scanning image analysis system and scanning method thereof

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Embodiment Construction

[0138] Embodiments of the present invention will be described in detail below.

[0139] The scanning method of the pathological slice scanning image analysis system is applied to the slide imaging scanning mirror 30 of the pathological slice scanning image analysis system. The slide imaging scanning mirror 30 includes a microscope barrel 31 and a main camera 33. The scanning method includes:

[0140] Reduce the magnification of the microscope barrel 31, thereby increasing the depth of field length of the microscope barrel 31 to obtain a larger clear imaging interval; the magnification of the microscope barrel 31 is six to fourteen times;

[0141] The imaging pixels of the main camera 33 are increased to obtain higher pixel density; the imaging pixels of the main camera 33 are greater than or equal to 4.5 million pixels.

[0142] Described microscope barrel 31 comprises eyepiece end, objective lens end, and described main camera 33 is installed on the eyepiece end of described ...

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Abstract

The invention discloses a pathological slice scanning image analysis system and its scanning method. The scanning method of the pathological slice scanning image analysis system is applied to the slide imaging scanning mirror of the pathological slice scanning image analysis system. The slide imaging scanning mirror includes Microscope barrel and main camera, the scanning method includes: reducing the magnification of the microscope barrel, thereby increasing the depth of field length of the microscope barrel to obtain a larger clear imaging interval; increasing the imaging pixels of the main camera to obtain higher pixel density. The scanning method of the pathological slice scanning image analysis system is to reduce the magnification of the microscope tube, thereby increasing the depth of field length of the microscope tube, increasing the imaging pixels of the main camera, and then achieving the pixel density and clarity that can only be achieved by the original magnification microscope tube; The longer the depth of field, the larger the interval corresponding to clear imaging, and the larger the tolerance rate, which can reduce the difficulty of focusing and focus quickly. At the same time, the requirements for the movement accuracy of the moving parts of the mechanical structure are relatively low.

Description

technical field [0001] The invention relates to the field of medical test equipment, in particular to a pathological slice scanning image analysis system and a scanning method thereof. Background technique [0002] At present, in the process of scanning slices performed by the slice scanning system, in order to obtain higher definition, it is generally desirable to use a microscope with a larger magnification. Most of the existing slide scanning systems use a microscope with a magnification of 20 to 40 times. The depth of field of a microscope with a 20 times magnification is generally between 1 micron and 1.4 microns depending on the brand. Because the surface of the slice is often rough and not Smooth, so that the near part of the image in the field of view observed by the objective lens is clear, but the far part is blurred. Therefore, in the process of slice scanning, due to the complicated structure of the mechanical focusing method of the microscope, the movement accur...

Claims

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Application Information

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Patent Type & AuthorityPatents(China)
IPC IPC(8): G01N21/00G01N21/01
CPCG01N21/00G01N21/01G01N2021/0112
Inventor方陕渊张凯闻
Owner广州英特美迪科技有限公司