Zero sample sketch retrieval method based on semantic adversarial network

A network and sketch technology, applied in the field of image processing, can solve the problems of weak discrimination ability of semantic information, transfer of visual knowledge of sketches to unseen classes, etc., and achieve the effect of reducing intra-class variance

Inactive Publication Date: 2019-08-27
XIDIAN UNIV
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Problems solved by technology

Although the above methods have achieved good performance, the two methods have not considered the problem of large variance within the sketch class, so the discriminative ability of the s

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  • Zero sample sketch retrieval method based on semantic adversarial network
  • Zero sample sketch retrieval method based on semantic adversarial network
  • Zero sample sketch retrieval method based on semantic adversarial network

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[0048] specific implementation plan

[0049] Below in conjunction with accompanying drawing and specific implementation, the present invention is described in further detail:

[0050] refer to figure 1 , the present invention is based on the zero-sample sketch retrieval method of the semantic confrontation network, and its implementation steps include the following:

[0051] Step 1, obtain the training sample set.

[0052] 1.1) Extract 10,400 RGB images and corresponding 10,400 binary sketch images from the Sketchy sketch retrieval database to form pairs of first training samples; extract 138,839 RGB images and 138,839 corresponding binary sketch images from the TU-Berlin sketch retrieval database. Binary sketch images of categories form pairs of second training samples;

[0053] 1.2) All the extracted 298,478 images are randomly flipped horizontally to obtain 298,478 randomly flipped images;

[0054] 1.3) Resize the 298,478 random horizontally flipped images to 224×224, a...

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Abstract

The invention provides a zero sample sketch retrieval method based on a semantic adversarial network, which mainly solves the problems that in the prior art, the sketch intra-class variance is larger,and the visual knowledge is difficult to migrate from a known class to a non-seen class under the zero sample setting. The method comprises the steps of obtaining a training sample set, constructinga semantic adversarial network, and extracting the RGB image features through a VGG16 network, constructing a generation network to generate the RGB image features with discriminability, inputting theto-be-retrieved sketch into a semantic confrontation network to generate the semantic features, inputting the semantic features and the random Gaussian noise into the generation network to generate the RGB image features, and searching the first 200 images most similar to the RGB image features in an image retrieval library to obtain a retrieval result. According to the method, the intra-class variance of the sketch image features is reduced, the RGB image features generated according to the sketch image in each class can be ensured, the retrieval performance of zero sample sketch retrieval is improved, and the method can be used for the electronic commerce, medical diagnosis and remote sensing imaging.

Description

technical field [0001] The invention belongs to the technical field of image processing, in particular to a zero-sample sketch retrieval method, which can be used in e-commerce, medical diagnosis and remote sensing imaging. Background technique [0002] Sketch retrieval refers to the retrieval of real natural images based on hand-drawn sketches. The zero-shot sketch retrieval method is a method for real-world image retrieval of hand-drawn sketches of unknown categories. Existing sketch retrieval methods are mainly divided into two categories: artificially designed features and deep learning-based methods. Among them, methods based on artificially designed features include gradient field HOG descriptors and SIFT descriptors, while methods based on deep learning include twin networks, triplet networks, deep sketch hashes, etc., and their main ideas are to extract image or text information. The discriminative features are then projected into a common feature space for similar...

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Application Information

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IPC IPC(8): G06F16/53G06N3/04
CPCG06F16/53G06N3/045
Inventor 杨延华许欣勋张啸哲邓成
Owner XIDIAN UNIV
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