Device and method for measuring square wave transform amplitude based on self-mixing interference

A technology of self-mixing interference and amplitude measurement, applied in measuring devices, measuring ultrasonic/sonic/infrasonic waves, using wave/particle radiation, etc., can solve the problems of frequency component masking, large counting errors, inappropriateness, etc., and achieve easy alignment Noise sensitivity, simple and reliable measurement method, and the effect of reducing the requirement of signal-to-noise ratio

Active Publication Date: 2020-09-29
XIAMEN UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The frequency domain measurement method is sensitive to external noise and has high requirements on the signal-to-noise ratio of the signal. When the noise becomes larger, the spectrum will be unstable, and useful frequency components are easily covered by the noise spectrum, and the measurement results will become inaccurate.
The traditional fringe counting method is divided into manual counting and automatic counting. The manual counting method is time-consuming when the vibration amplitude of the measured object is large, while the traditional automatic counting method tends to count the noise voltage fluctuation at the threshold as an effective fringe, resulting in relatively large large count error
At the same time, the accuracy of the fringe counting method can usually only reach λ / 2, so it is not suitable for simple and stable measurement in real time and applications requiring nanometer-level high-precision resolution

Method used

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  • Device and method for measuring square wave transform amplitude based on self-mixing interference
  • Device and method for measuring square wave transform amplitude based on self-mixing interference
  • Device and method for measuring square wave transform amplitude based on self-mixing interference

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Embodiment 1

[0038] Please refer to figure 2 As shown, the present invention discloses a square wave transform amplitude measurement device based on self-mixing interference, which includes a light source unit, a signal processing unit and a data processing unit.

[0039] The light source unit is used to monitor the vibrating object to be measured to generate a self-mixed laser intensity signal and convert it into a corresponding current signal; the signal processing unit processes the signal output by the light source unit to obtain the required square wave signal; the data processing unit analyzes and calculates the square wave signal to obtain the amplitude and frequency of the vibrating object to be measured.

[0040] In this embodiment, the light source unit includes a semiconductor laser, a photodetector and a laser driving circuit respectively connected to the semiconductor laser. The photodetector is packaged in a semiconductor laser, and the laser light of the semiconductor lase...

Embodiment 2

[0050] Please refer to image 3 As shown, the present invention also provides a method for measuring the amplitude of square wave transformation based on self-mixing interference, which includes three core steps.

[0051] S1. Signal generation and output: The outgoing light of the semiconductor laser hits the surface of the vibrating object to be measured, and part of the light returns to the laser cavity to generate a self-mixing laser intensity signal; the photodetector detects the self-mixing laser intensity signal and converts it into a corresponding current signal output.

[0052] S2. Signal processing: convert the current signal into a voltage signal and amplify the signal; input the amplified voltage signal into the hysteresis comparator, and adjust the upper and lower threshold voltages of the hysteresis comparator within the range of the signal amplitude to make the output square In the wave signal, the number of square waves per unit time is the largest and the glit...

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Abstract

The invention discloses a square wave transformation amplitude measuring device based on self-mixing interference. The device comprises a light source unit, a signal processing unit and a data processing unit, wherein the signal processing unit introduces a hysteresis comparator to process signals so as to output required square wave signals, and the data processing unit searches for turning points for the output square wave signals so as to calculate the vibration amplitude of an object according to the number of fringes in the same inclined direction between adjacent turning points. The invention also discloses a square wave transformation amplitude measurement method based on self-mixing interference. According to the invention, the hysteresis comparator circuit with adjustable upper and lower limits is adopted to perform square wave transformation on an obtained laser self-mixing signal, so that the influence of external noise on the measurement stability and accuracy is effectively reduced. The self-mixing interference principle is adopted with no specific requirement on the coherence of the laser light source, so that the laser has large selection freedom. Meanwhile, the amplification factor of the signal is controllable, the measurable minimum amplitude value can reach a nanometer level, and wide-range real-time measurement is easy to realize.

Description

technical field [0001] The invention relates to the field of optical nanometer measurement technology, in particular to a square wave transform amplitude measurement device and method based on self-mixing interference. Background technique [0002] Nano-vibration measurement is becoming more and more important in many applications such as high-precision engineering technology, precision machining, and aerospace. At present, researchers have proposed some meaningful methods for measuring the amplitude of weakly vibrating objects. Among them, the measurement method based on optical technology has the advantages of non-contact and high precision, and has attracted much attention. [0003] Commonly used optical vibration measurement methods include geometric optics and optical interferometry. However, most of the reported geometric optics methods require complex and precise optical adjustment systems; in the field of laser interferometry, due to its simple optical structure an...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01H9/00
CPCG01H9/00
Inventor 黄文财陈汉桥熊彦彬杨惠茹冯腾
Owner XIAMEN UNIV
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