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Binocular grating projection measuring method based on spatial phase unwrapping

A technology of spatial phase and grating projection, applied in the field of visual inspection, can solve problems such as affecting measurement accuracy and increasing image processing steps, to achieve the effects of improving measurement efficiency, reducing the number of projections, and shortening processing steps

Active Publication Date: 2019-10-25
易思维(杭州)科技有限公司
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Problems solved by technology

Obtaining the absolute phase is one of the difficulties in spatial phase unwrapping. The usual method is to identify some features on the image captured by the camera as the starting point, which increases the steps of image processing, and the accuracy of identification will affect the accuracy of subsequent measurements.

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  • Binocular grating projection measuring method based on spatial phase unwrapping
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  • Binocular grating projection measuring method based on spatial phase unwrapping

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Embodiment Construction

[0038] The technical solutions of the present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0039] A binocular grating projection measurement method based on spatial phase expansion, comprising the following steps:

[0040] 1) The projector 4 projects the stripes 2 on the surface of the object under test 1, and the two cameras 3 collect images respectively;

[0041] 2) Process the collected images and calculate the phase respectively. When the obtained phase value is less than 0, add 2π to the phase value so that the phase is between 0 and 2π to obtain the main phase value; There is a sudden change in a pixel that is abnormal to regular changes, such as image 3 (b) and Figure 4 shown;

[0042] 3) Take the sudden change position as the zero point, then use the spatial phase expansion method to obtain the absolute phase, and then use the epipolar line constraint to determine the point with the same name...

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Abstract

The invention discloses a binocular grating projection measuring method based on spatial phase unwrapping. The method comprises the following steps of (1) projecting a stripe on a surface of an objectto be measured with a projector and collecting images with two cameras, (2) processing the collected images and calculating phases, wherein an obtained phase value is smaller than zero, 2*pi is addedto the phase value such that the phases are between 0 and 2*pi to obtain a phase main value, wherein one pixel in a phase main value graph has mutation different from a regular change, and (3) calculating an absolute phase by using a spatial phase unwrapping method with a mutation position as a zero point, determining a same name point by using outer pole line constraint, and solving the three-dimensional information of the position to be measured. According to the binocular grating projection measuring method based on spatial phase unwrapping, the absolute phase can be obtained by a recognition stripe by designing the projection stripe, and the influences of an image feature extraction step and the extraction precision on the overall measurement precision are reduced.

Description

technical field [0001] The invention relates to the field of visual detection, in particular to a binocular grating projection measurement method based on spatial phase expansion. Background technique [0002] Stereo vision uses the relationship between multiple cameras known in space to calculate the three-dimensional shape information of the measured object. Binocular stereo vision is the simplest and most widely used visual model. The binocular stereo vision system aims to obtain the three-dimensional information of the object through the calculation of the mathematical model after matching the same-name points, so finding the same-name points becomes the key to binocular stereo vision. [0003] In industrial applications and reverse engineering, it is often necessary to obtain the three-dimensional shape of the target object to establish a mathematical model of the object, so a large amount of three-dimensional data on the surface of the object is required. Matching bas...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/25
CPCG01B11/254
Inventor 曾小婉张楠楠郭寅郭磊
Owner 易思维(杭州)科技有限公司
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