Wafer support pedestal with adjustable radio frequency assembly

A support seat and wafer technology, applied in electrical components, discharge tubes, circuits, etc., can solve problems such as difficult to achieve precise control and limit the degree of freedom of plasma

Pending Publication Date: 2019-10-25
PIOTECH CO LTD
View PDF5 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, known configurations still do not easily achieve these precise controls, and even limit the degrees of freedom for plasma tuning.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Wafer support pedestal with adjustable radio frequency assembly
  • Wafer support pedestal with adjustable radio frequency assembly
  • Wafer support pedestal with adjustable radio frequency assembly

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0029] The present invention will now be described more fully hereinafter with reference to the accompanying drawings, in which certain exemplary embodiments are shown by way of illustration. However, claimed subject matter may be embodied in many different forms, and thus constructions of covered or claimed subject matter are not limited to any example embodiments disclosed in this specification; the example embodiments are merely illustrations. Likewise, the invention resides in providing a reasonably broad scope for claimed subject matter as claimed or covered. Among other things, for example, claimed subject matter may be embodied as a method, apparatus, or system. Thus, embodiments may take the form of, for example, hardware, software, firmware or any combination of these (known not to be software).

[0030] The term "in one embodiment" used in this specification does not necessarily refer to the same embodiment, and the use of "in other (some / some) embodiments" in this ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides a wafer support pedestal, which comprises a disk body, wherein the disk body is provided with a bearing surface, a first lower electrode and a second lower electrode, wherein the bearing surface is used for bearing a wafer, the first lower electrode and the second lower electrode are positioned below the bearing surface, the first lower electrode and the second lower electrode are mutually independent in structure, and the first lower electrode is positioned above the second lower electrode.

Description

technical field [0001] The present invention relates to wafer supports for the manufacture of semiconductor structures, in particular wafer supports suitable for plasma processing, generally equipped with partial components of radio frequency circuits. Background technique [0002] Plasma processing is used in the manufacture of technologies such as integrated circuits, photomasks, plasma displays and solar energy. In the manufacture of integrated circuits, wafers are processed by plasma chambers, such as etching, chemical vapor deposition PECVD or physical vapor deposition PEPVD. For smaller integrated circuits, the control of processing parameters needs to be more precise, such as plasma energy spectrum, plasma energy radial distribution, plasma density and plasma density radial distribution. Especially the plasma density, which determines the deposition rate and etch rate of the wafer surface. The radial distribution of plasma density and the radial distribution of plas...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): H01J37/32
CPCH01J37/32715H01J37/32568H01J37/32137H01J37/32183H01J37/32541H01J37/32091H01J2237/3321H01J2237/334
Inventor 周仁王卓
Owner PIOTECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products