Micro-defect ultrasonic detection signal processing method considering surface roughness
A technology for surface roughness and ultrasonic testing, which is applied in the processing of detection response signals, the use of sound waves/ultrasonic waves/infrasonic waves to analyze solids, and the use of sound waves/ultrasonic waves/infrasonic waves for material analysis, etc. It can solve the problems of difficult identification of fine defect signals , to improve the ability and reliability of ultrasonic detection of micro-defects under the influence of rough surfaces, improve the signal-to-noise ratio, and preserve the integrity of the effect
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0034] Such as figure 2 As shown, a micro-defect ultrasonic detection signal processing method considering surface roughness includes the following steps:
[0035] S1. Build a detection system to obtain ultrasonic detection signals of fine defects 12 under the influence of rough surface 11;
[0036] Such as figure 1 As shown, the detection system includes an ultrasonic probe 2 and an ultrasonic instrument 3. The ultrasonic probe 2 generates ultrasonic waves under the excitation of the ultrasonic instrument 3. The ultrasonic waves enter the workpiece 1 to be measured in the coupling medium, and longitudinal waves are generated in the workpiece 1 to be measured. Or shear wave for detection, when the sound beam encounters the fine defect 12 and then reflects, the reflected sound beam is received and displayed by the ultrasonic instrument 3 as an echo signal.
[0037] S2, using such as Figure 4 As shown, the wavelet mother function of coif4 in the Coiflet series of wavelets ...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap