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A device capable of detecting cell back field defects and its debugging method

A battery chip and defect technology, which is applied in the direction of optical test defects/defects, semiconductor/solid-state device test/measurement, circuits, etc., can solve the problems of increasing errors, flowing to the finished product area, defects and customer complaints, and meet the delay requirements Reduced effect

Active Publication Date: 2022-04-01
TONGWEI SOLAR HEFEI +1
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] At present, screen printing is divided into back electrode, back electric field, and front printing. With the continuous improvement of the market's requirements for cell quality and the continuous decrease of revenue, the company adopts cost reduction, efficiency increase and reduction of defective production to improve product quality and revenue. To reduce the number of employees while ensuring product quality can only be solved by adjusting the equipment. Due to the implementation of the cost reduction and efficiency increase plan, only one employee can look at the line in the first and second lines, and it is impossible to find the missing back electrode and the back electric field in time. Missing and crossing will lead to the risk of bad batches flowing into the sorting end and causing customer complaints
[0003] Screen printing is divided into printing, sintering and sorting. Defects caused by printing can only be sorted by the sorting film color sorter. At this time, the defects have flowed to the finished product area and cannot be reworked, which may cause batch defects and customer complaints. risks of
[0004] In the prior art, there is a solar cell defect detection method with application number "201010510730.8", which discloses the problem of taking photos of the cells with a camera and sending them to a computer for identification to determine whether there are defects in the cells, but the above-mentioned The defect detection method still has the following obvious defects in the process of using the camera: 1. The battery is always in the process of moving, while the camera is always in a static state, which makes the camera require a delay in the camera's shooting action during the process of taking pictures Very high, which makes it necessary to purchase high-quality and high-priced cameras when choosing a shooting camera, which will increase the cost of defect detection equipment; 2. After the cell pictures obtained by taking pictures are transferred to the computer, the cells can be obtained by direct observation by humans Black dots on the picture to determine whether there are defects, which undoubtedly cannot solve the labor force of workers, and the way of artificial observation will greatly increase the possibility of error, making the defect detection effect worse

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  • A device capable of detecting cell back field defects and its debugging method
  • A device capable of detecting cell back field defects and its debugging method
  • A device capable of detecting cell back field defects and its debugging method

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Embodiment Construction

[0024] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0025] see Figure 1-6 , the present invention provides a technical solution:

[0026] A device capable of detecting back field defects of cells, comprising a transport conveyor belt 2 arranged at the exit of a secondary oven 1, the transport conveyor belt 2 can transport the cells 10 dried by the secondary oven 1, and Control the selected transport conveyor belt 2 to have the same width as the battery sheet 10, so that when the camera 8 takes pictures, only ...

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Abstract

The invention discloses a device capable of detecting defects in the back field of battery chips, which includes a transport conveyor belt, above which a butt conveyor belt rotating at the same speed is arranged, and a plurality of connecting rods are connected at intervals on the butt conveyor belt, and the connecting rods An adjustment push rod is vertically connected to one end away from the docking conveyor belt. One end of the rod body of the adjustment push rod is fixedly connected to a mounting block. A camera is fixedly connected to the side of the block away from the connecting rod, and the camera is communicatively connected to the computer, and the adjusting push rod is electrically connected to the computer. The invention achieves the purpose of reducing the time delay of camera shooting action, so that ordinary industrial cameras can also well complete the function of taking pictures of the back of the cell, realize the function of intelligent automatic identification of back field defects, and liberate the labor force of workers. Improve the accuracy of back field detection to a great extent.

Description

technical field [0001] The invention relates to the technical field of screen printing detection, in particular to a device capable of detecting battery sheet back field defects and a debugging method thereof. Background technique [0002] At present, screen printing is divided into back electrode, back electric field, and front printing. With the continuous improvement of the market's requirements for cell quality and the continuous decrease of revenue, the company adopts cost reduction, efficiency increase and reduction of defective production to improve product quality and revenue. To reduce the number of employees while ensuring product quality can only be solved by adjusting the equipment. Due to the implementation of the cost reduction and efficiency increase plan, only one employee can look at the line in the first and second lines, and it is impossible to find the missing back electrode and the back electric field in time. Missing and crossing will lead to the risk o...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/88H01L21/66
CPCG01N21/8851H01L22/12H01L22/20G01N2021/8887
Inventor 朱劲松熊志宏
Owner TONGWEI SOLAR HEFEI