A device capable of detecting cell back field defects and its debugging method
A battery chip and defect technology, which is applied in the direction of optical test defects/defects, semiconductor/solid-state device test/measurement, circuits, etc., can solve the problems of increasing errors, flowing to the finished product area, defects and customer complaints, and meet the delay requirements Reduced effect
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[0024] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0025] see Figure 1-6 , the present invention provides a technical solution:
[0026] A device capable of detecting back field defects of cells, comprising a transport conveyor belt 2 arranged at the exit of a secondary oven 1, the transport conveyor belt 2 can transport the cells 10 dried by the secondary oven 1, and Control the selected transport conveyor belt 2 to have the same width as the battery sheet 10, so that when the camera 8 takes pictures, only ...
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