Fabric defect pixel-level classification method based on deep learning
Patent Information
- Authority / Receiving Office
- CN Β· China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- XI'AN POLYTECHNIC UNIVERSITY
- Publication Date
- 2019-11-22
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Abstract
Description
technical field
[0001] The invention belongs to the technical field of image segmentation, and relates to a pixel-level classification method for fabric defects based on deep learning. Background technique
[0002] The competition in the textile industry is becoming increasingly fierce. The last process after the cloth weaving is usually fabric defect detection, and then evaluates the product grade. of great pressure. Aiming at the detection of fabric surface defects, many domestic and foreign scholars have done related research. These detection methods can be divided into three categories: statistical-based methods, frequency-domain-based methods, model-based methods, and learning-based methods. Statistical-based methods rely on the choice of parameters, which are less accurate and less precise. The detection result of the method based on the frequency domain depends on the selection of the filter, and the detection effect on complex textured fabrics is poor. The model-...