An Industrial Cone Beam CT Reconstruction Method in Offset Scanning Mode

A scanning mode and offset technology, applied in the direction of measuring devices, 2D image generation, instruments, etc., to achieve good engineering application value and increase the effect of imaging field of view

Active Publication Date: 2021-05-28
BEIHANG UNIV
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Problems solved by technology

[0006] An embodiment of the present invention provides an industrial cone-beam CT reconstruction method in offset scanning mode to solve the problem of accurate complete tomographic reconstruction of the inspected sample in the existing offset sample stage scanning mode

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  • An Industrial Cone Beam CT Reconstruction Method in Offset Scanning Mode
  • An Industrial Cone Beam CT Reconstruction Method in Offset Scanning Mode
  • An Industrial Cone Beam CT Reconstruction Method in Offset Scanning Mode

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Embodiment Construction

[0045] The specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. The following examples are used to illustrate the present invention, but are not intended to limit the scope of the present invention.

[0046]In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0047] Aiming at the geometric layout o...

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Abstract

The invention provides an industrial cone beam CT reconstruction method in offset scanning mode. In order to realize CT reconstruction in offset sample stage scanning mode, the actual offset sample stage CT scanning mode is converted into offset by establishing a virtual detector. Detector CT scanning method, and finally use the existing Wang-FDK offset detector scanning mode reconstruction method to obtain accurate CT images of the inspected sample. The invention solves the problem of CT reconstruction in the scanning mode of the offset sample stage, greatly increases the imaging field of view of the CT system without changing the geometric layout of standard cone-beam CT scanning, and has good engineering application value.

Description

technical field [0001] Embodiments of the present invention relate to the technical field of computed tomography, and in particular to an industrial cone-beam CT reconstruction method in offset scan mode. Background technique [0002] CT (Computed Tomography, computer tomography) is a non-destructive testing method that uses the projection information of objects under different viewing angles, combined with image reconstruction algorithms, to obtain internal quality status and structural information of objects. Has a wide range of applications. [0003] Standard cone-beam CT scan figure 1 As shown, when a standard cone beam CT scan is performed, the X-ray source 1 emits cone beam rays 2 , the sample 3 to be inspected is placed on the sample rotating platform 4 , and the cross section of the sample is completely enveloped by the cone beam rays 2 . The tested sample 3 rotates 360° stepwise around the rotation center 5. During this process, the real detector 6 collects the pr...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06T11/00G01N23/046
CPCG01N23/046G06T11/005G06T11/006G06T2211/416
Inventor 杨民林强孙亮吴雅朋张晓敏
Owner BEIHANG UNIV
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