Multi-mark distance measurement learning method based on interactive modeling

A distance measurement and learning method technology, applied in character and pattern recognition, instruments, computer parts and other directions, can solve the problems of high complexity of multi-label learning, less feature space processing, and difficult application, to promote practical applications, reduce The effect of complexity

Inactive Publication Date: 2019-12-20
RES INST OF ARTIFICIAL INTELLIGENCE OF AI VALLEY NANJING LTD
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AI Technical Summary

Problems solved by technology

However, due to the compositional nature of the label space, multi-label learning has high complexity and is difficult to apply to practical scenarios
Existing multi-label learning methods mostly start from the label space to model the correlation between labels, and do less processing of the feature space

Method used

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  • Multi-mark distance measurement learning method based on interactive modeling
  • Multi-mark distance measurement learning method based on interactive modeling
  • Multi-mark distance measurement learning method based on interactive modeling

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Embodiment Construction

[0039] The present invention will be described in further detail below in conjunction with the accompanying drawings and specific embodiments.

[0040] Such as figure 1 As shown, the present invention is a multi-label distance metric learning method based on feature space and label space interactive modeling, comprising the following steps:

[0041] (1) Sample arbitrary multi-label application scenarios such as images, videos, texts, etc., obtain training data, extract corresponding features and manually label, and obtain training data D={(x i ,y i )|1≤i≤m}, where x i ∈χ is a d-dimensional feature vector, for example x i collection of tags.

[0042] (2) Preprocess the extracted training samples, and filter out the samples whose mark occupancy rate is less than the set threshold, so as to improve the sample quality.

[0043] (3) Based on the Mahalanobis distance metric learning framework, considering the structured interaction between feature space and label space in mul...

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Abstract

The invention discloses a multi-mark distance measurement learning method based on interactive modeling, and the method comprises the steps of extracting the training data of any multi-mark application scene, and carrying out the multi-mark marking on the training data; preprocessing the extracted training samples to improve the quality of the samples; expressing a distance measurement matrix to be learned as a combined distance measurement form; defining the multi-mark semantic similarity based on feature and mark collaborative calculation, and constructing a triple constraint set; constructing a multi-mark distance measurement learning model in combination with the combined distance measurement and the triple constraint set, and performing optimization solution on the multi-mark distancemeasurement learning model; after learning the distance measurement, mapping the training data to the distance measurement space, and then learning by using an existing multi-mark learning algorithmto obtain a multi-mark classifier based on the distance measurement learning; and inputting a to-be-predicted sample into the above classifier to obtain a labeled sample. According to the method, thetime complexity of the multi-mark learning system can be greatly reduced, and the practicability of the multi-mark learning framework is improved.

Description

technical field [0001] The invention relates to a multi-label distance metric learning method based on interactive modeling, in particular to a multi-label distance metric learning method based on interactive modeling of feature space and label space, which is applicable to any multi-label learning scene and belongs to machine learning technology field. Background technique [0002] In recent years, multi-label learning has received extensive attention from researchers and a large number of research results have emerged. However, due to the compositional nature of the label space, multi-label learning has high complexity and is difficult to apply to practical scenarios. The existing multi-label learning methods mostly start from the label space to model the correlation between labels, and do less processing of the feature space. Analyzing multi-label data, there is redundancy in the feature space. Therefore, how to construct a suitable multi-label distance metric represent...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06K9/62
CPCG06F18/24147G06F18/214
Inventor 不公告发明人
Owner RES INST OF ARTIFICIAL INTELLIGENCE OF AI VALLEY NANJING LTD
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