Horizontal electrode configuration structure for nanoscale phase-change memory cells

A technology of phase change memory and configuration structure, applied in the field of microelectronics, can solve the problems of small read current, inability to read correctly, too small read current, large amorphous phase resistance, etc., so as to facilitate correct reading and reduce Threshold current, the effect of increasing the read current

Active Publication Date: 2021-04-30
HUAZHONG UNIV OF SCI & TECH
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  • Abstract
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  • Claims
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Problems solved by technology

Especially below the 10nm scale, the resistance of the amorphous phase becomes very large, resulting in too small a read current to read correctly, and a larger current is required to read
[0005] Therefore, it is necessary to propose a new electrode configuration structure suitable for nanoscale phase change units to solve the problem of too small read current and power consumption in the process of high-resistance amorphization at the nanoscale

Method used

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  • Horizontal electrode configuration structure for nanoscale phase-change memory cells
  • Horizontal electrode configuration structure for nanoscale phase-change memory cells
  • Horizontal electrode configuration structure for nanoscale phase-change memory cells

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Embodiment Construction

[0028] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not constitute a conflict with each other. The present invention will be further described in detail below in combination with specific embodiments.

[0029] As a preferred embodiment of the present invention, such as figure 1 As shown, the present invention provides a horizontal electrode configuration structure for nanoscale phase change memory cells, wherein:

[0030] The horizontal electrode configuration structure 100 includes an up...

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Abstract

The invention discloses a horizontal electrode configuration structure for a nanoscale phase-change memory unit, wherein: the horizontal electrode configuration structure includes an upper electrode material layer and a lower phase-change material layer; the upper electrode material layer includes an outer ring common drain grounded upper electrode and the upper layer electrode of the inner source end, the upper layer electrode of the inner source end is located in the upper layer electrode of the outer ring common drain grounding, and there is an annular groove between the two; the upper layer electrode of the inner source end is connected to the source end, the upper layer electrode of the outer ring common drain grounding is common drain grounded, The source and drain terminals cannot be exchanged, and the current flows horizontally from the equipotential surface of the upper electrode of the inner source terminal to the equipotential surface of the outer ring of the upper electrode of the outer ring common drain ground. For the high-resistance amorphous state, compared with the square structure, the equivalent resistance value R is significantly reduced, and the read current is increased, which is convenient for correct reading. Moreover, the horizontal flow of current reduces the current loss of elements connected in series at both ends in a general sense, thereby reducing the threshold current required for the amorphization process and reducing the overall power consumption.

Description

technical field [0001] The invention belongs to the field of microelectronics, and relates to a horizontal electrode configuration structure for a nanoscale phase-change memory unit, in particular to the design and application of a phase-change memory element based on a chalcogenide phase-change material. Background technique [0002] The phase change memory based on the chalcogenide phase change material can store information and data through the huge resistance difference between the crystalline phase and the amorphous phase, and can even achieve multi-level phase change storage. This phase-change process has the advantages of low power consumption and high-density cost as the size decreases, so the industry pays great attention to the development of nanoscale phase-change memory. [0003] At present, there are relatively mature applications in the structural design of phase change units, such as T-shaped structure and side wall contact structure, etc. The purpose is to re...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L45/00
CPCH10N70/231H10N70/841
Inventor 马平童浩缪向水
Owner HUAZHONG UNIV OF SCI & TECH
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