Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Database testing method and device

A testing method and database technology, applied in the field of computer and database, can solve the problems of large data scale, high computing cost, complex node attribute and node relationship, etc., and achieve the effect of improving processing capacity and increasing robustness.

Active Publication Date: 2020-01-10
BEIJING BAIDU NETCOM SCI & TECH CO LTD
View PDF8 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The current graph database system mainly faces the huge challenge of 4V+C
4V refers to the following four points: (1) Large data scale, diverse node attributes, and complex node relationships
(2) It is difficult to extract fixed patterns from real data
(3) Consistency after dynamic data changes
(4) Graph analysis is difficult to provide decision support for data in different fields
C means: There is a correlation between any nodes in the large graph, and the calculation cost involves global data, and the calculation cost is too high

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Database testing method and device
  • Database testing method and device
  • Database testing method and device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0054]Exemplary embodiments of the present application are described below in conjunction with the accompanying drawings, which include various details of the embodiments of the present application to facilitate understanding, and they should be regarded as exemplary only. Accordingly, those of ordinary skill in the art will recognize that various changes and modifications of the embodiments described herein can be made without departing from the scope and spirit of the application. Also, descriptions of well-known functions and constructions are omitted in the following description for clarity and conciseness.

[0055] The database testing method provided by the embodiment of the present application, such as figure 1 shown, including:

[0056] Step S11: Test the database under test including abnormal data, and obtain a first test result.

[0057] Step S12: When the first test result shows that the database is normal, test the running status of the server cluster of the test...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a database testing method and device, and relates to the field of databases. According to the specific implementation scheme, the database testing method comprises the steps oftesting a tested database comprising abnormal data to obtain a first test result; under the condition that the first test result shows that the database is normal, testing the running state of the server cluster of the tested database according to the resource allocation condition, and obtaining a second test result; and under the condition that the second test result is that the server cluster of the database is normal, monitoring a data change condition in the database to obtain a third test result. According to the database testing method, a more comprehensive and accurate database test result can be provided, and the robustness of the database can be improved.

Description

technical field [0001] This application relates to the field of computers, especially to the field of databases. Background technique [0002] With the continuous development of applications such as knowledge graphs and complex networks, graph databases play an increasingly important role. Big graph data in different fields involves not only the information of the nodes themselves, but also the structural relationship between nodes. The current graph database system mainly faces the huge challenge of 4V+C. 4V refers to the following four points: (1) The data scale is large, the node attributes are diverse, and the node relationship is complex. (2) It is difficult to extract fixed patterns from real data. (3) The consistency problem after the data changes dynamically. (4) Graph analysis is difficult to provide decision support for data in different fields. C means: There is a correlation between any nodes in the large graph, and the calculation cost involves global data,...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22
CPCG06F11/2205G06F11/2273Y02D10/00
Inventor 杨万浩郭方园晋小玲宋静
Owner BEIJING BAIDU NETCOM SCI & TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com