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Method and equipment for detecting appearance defects of backboard of electronic equipment

A technology of electronic equipment and flaw detection, applied in the computer field, can solve problems such as indistinguishable definitions

Inactive Publication Date: 2020-02-21
SHANGHAI WANWUXINSHENG ENVIRONMENTAL PROTECTION TECH GRP CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] At present, the defect detection of the backplane appearance of second-hand electronic devices such as mobile phones is mainly based on traditional image algorithms, through color space transformation, filtering, feature point extraction, and pattern matching. Traditional detection methods can only A defect is detected in a certain area, but the definition of the defect cannot be distinguished

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  • Method and equipment for detecting appearance defects of backboard of electronic equipment
  • Method and equipment for detecting appearance defects of backboard of electronic equipment
  • Method and equipment for detecting appearance defects of backboard of electronic equipment

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Embodiment Construction

[0055] The present invention will be described in further detail below in conjunction with the accompanying drawings.

[0056] In a typical configuration of the present application, the terminal, the device serving the network and the trusted party all include one or more processors (CPUs), input / output interfaces, network interfaces and memory.

[0057] Memory may include non-permanent storage in computer-readable media, in the form of random access memory (RAM) and / or nonvolatile memory, such as read-only memory (ROM) or flash memory (flashRAM). Memory is an example of computer readable media.

[0058] Computer-readable media, including both permanent and non-permanent, removable and non-removable media, can be implemented by any method or technology for storage of information. Information may be computer readable instructions, data structures, modules of a program, or other data. Examples of computer storage media include, but are not limited to, phase change memory (PRAM...

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Abstract

The invention aims to provide a method and equipment for detecting appearance defects of a backboard of electronic equipment. The method comprises the following steps: acquiring an appearance image ofthe electronic equipment; extracting a backboard appearance area image of the electronic equipment from the appearance image of the electronic equipment, and adjusting the backboard appearance area image into an image with the same length and width; inputting the adjusted backboard appearance area image into a model of the FPN network combined with the backbone network after training is finished;receiving an output defect detection result of the backboard appearance area of the electronic equipment from the model of combining the FPN with the backbone network, wherein the defect detection result comprises the defect type of the backboard of the electronic equipment, the position of the defect in the backboard of the electronic equipment and the confidence coefficient of the defect detection result. The defect difference of the appearance of the backboard of the second-hand electronic equipment such as a mobile phone can be accurately identified.

Description

technical field [0001] The invention relates to the field of computers, in particular to a method and equipment for detecting defects on the backplane of an electronic device. Background technique [0002] At present, the defect detection of the backplane appearance of second-hand electronic devices such as mobile phones is mainly based on traditional image algorithms, through color space transformation, filtering, feature point extraction, and pattern matching. Traditional detection methods can only A defect is detected in an area, but the definition of the defect cannot be distinguished. Contents of the invention [0003] An object of the present invention is to provide a method and equipment for detecting defects on the backplane of an electronic device. [0004] According to one aspect of the present invention, there is provided a method for detecting appearance defects on the backplane of an electronic device, the method comprising: [0005] Obtain an image of the a...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00G06K9/32G06N3/04
CPCG06T7/0002G06V10/25G06N3/045
Inventor 徐鹏沈圣远常树林姚巨虎
Owner SHANGHAI WANWUXINSHENG ENVIRONMENTAL PROTECTION TECH GRP CO LTD