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A correction method for multi-segment single-point correction parameters of infrared images

A technology for correcting parameters and infrared images, which is applied in the direction of optical device exploration, geophysical measurement, instruments, etc., to achieve the effect of improving quality

Active Publication Date: 2022-02-08
北京长峰科威光电技术有限公司
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Problems solved by technology

[0004] The purpose of the present invention is to improve the deficiencies of the existing two-point multi-segment single-point correction method for infrared detector images, and provide a multi-segment correction parameter correction method in order to further improve the quality of infrared images

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  • A correction method for multi-segment single-point correction parameters of infrared images
  • A correction method for multi-segment single-point correction parameters of infrared images
  • A correction method for multi-segment single-point correction parameters of infrared images

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Embodiment Construction

[0040] The present invention is an improvement based on the existing infrared detector image two-point multi-segment correction method and the two-point multi-segment single-point correction method. The point correction method is explained:

[0041] 1. Two-point multi-segment correction method:

[0042] The two-point correction method is based on the two assumptions that the response of each detection unit is linear and the response of the detection unit must have time stability.

[0043] The two-point correction method is to convert the signal V of each unit of the detector at two incident radiations φ(T1) and φ(T2) si corrected for consistent average signal V s (T1) and V s (T2), the process is mainly composed of two parts: calibration and compensation. First, it is necessary to measure the output responses H(i,j) and L(i,j) of each unit of the detector under the conditions of two uniform radiation φ(T1) and φ(T2) at different temperatures, and then the following formula...

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Abstract

The present invention proposes a multi-segment single-point correction parameter correction method for infrared images. By using the characteristic that the gain of the response curve of the detector does not change much under the condition of multiple start-ups at different times, the multi-segment correction compensation parameters of different temperature segments are individually corrected. , to improve the existing two-point multi-segment single-point correction algorithm to use the same set of compensation parameters in different temperature segments, so that it can still obtain better non-uniformity correction effects in other temperature segments other than the initial temperature segment, thereby further improving The quality of infrared images.

Description

technical field [0001] The invention belongs to the technical field of infrared imaging and infrared detectors, and relates to a non-uniformity correction technology for infrared images, in particular to a multi-segment single-point correction parameter correction method for infrared detector images. Background technique [0002] Due to the inconsistency of the responsivity of each unit of the infrared detector, the existence of factors such as the readout circuit and the coupling between the readout circuit and the detector, the resulting infrared image has non-uniformity, such as figure 1 shown. This will significantly reduce the ability of the infrared imaging system to resolve temperature and target details, seriously affecting the practical application of the infrared imaging system. Therefore, it is necessary to correct the non-uniformity of the infrared imaging system to reduce the fixed pattern noise and improve the imaging quality. [0003] The existing non-uniform...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01V8/10G01V13/00
CPCG01V8/10G01V13/00
Inventor 毛建森孙军月王沛
Owner 北京长峰科威光电技术有限公司