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Test device and test method for phase shifter

A test device and phase shifter technology, applied in the direction of measuring devices, instruments, measuring electrical variables, etc., can solve the problems of high price, high cost, inconvenient measurement, etc., and achieve the effect of convenient use and reduced measurement cost

Active Publication Date: 2022-04-08
CALTERAH SEMICON TECH SHANGHAI CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, due to the high price, the method of measuring the phase offset of the above-mentioned phase shifter is expensive and inconvenient to measure

Method used

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  • Test device and test method for phase shifter
  • Test device and test method for phase shifter
  • Test device and test method for phase shifter

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0057] figure 1 Schematic structure of a test device for a phase shifter provided by an embodiment of the present invention Figure 1 . see figure 1 As shown, the embodiment of the present invention provides a test device for a phase shifter. The phase shifter 10 is used to generate a transmission signal according to the first radio signal provided by the first signal source 20. The test device may include a signal receiving and mixing module 30 and oscilloscope 40 and other components.

[0058] The signal receiving and mixing module 30 can be respectively connected with the phase shifter 10 and the first signal source 20, and the signal receiving and mixing module 30 can be used to receive the transmission signal output by the phase shifter 10 as the second radio signal, and the The second radio signal is mixed with the first radio signal to generate a first mixed frequency signal. In addition, the above-mentioned signal receiving and mixing module 30 can also be used to ...

Embodiment 2

[0071] figure 2 Schematic structure of a test device for a phase shifter provided by an embodiment of the present invention Figure II . see figure 2 As shown, on the basis of the first embodiment above, the test device for the phase shifter provided by this embodiment, the signal receiving and mixing module 30 may include a first amplifier 301, a first mixer 302 and a second amplifier connected in sequence 303 and other devices.

[0072] Wherein, the signal input end of the first amplifier 301 is used for receiving the second radio signal, and the two signal input ends of the first mixer 302 are respectively connected with the signal output end of the first amplifier 301 and the first signal source 20; and

[0073] The signal input end of the second amplifier 303 is connected to the signal output end of the first mixer 302 , and the signal output end of the second amplifier 303 is connected to the signal input end of the oscilloscope 40 .

[0074] Wherein, both the firs...

Embodiment 3

[0078] image 3 Schematic structure of a test device for a phase shifter provided by an embodiment of the present invention Figure three . see image 3 As shown, in this embodiment, the phase shifter 10 is integrated in a radio frequency device, wherein the first signal source 20 is a radio frequency signal source.

[0079] Wherein, the first radio signal provided by the first signal source 20 includes a radio frequency signal, a microwave signal, etc., and the radio frequency signal may include a millimeter wave signal, a centimeter wave signal, and the like. It is applicable to the phase test of the phase shifter 10 in the radar chip, wherein the radar chip may be an Aip (antenna in package) millimeter wave radar chip.

[0080] In a specific implementation, the radio frequency device may also include components such as a transmitting antenna 50 and a receiving antenna 60;

[0081] The signal output end of phase shifter 10 is connected with transmitting antenna 50, and p...

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Abstract

The present invention provides a testing device and testing method for a phase shifter. The phase shifter is used to generate a transmission signal according to a first radio signal provided by a first signal source. The testing device includes: a signal receiving and mixing module, and a first signal source Connected, the signal receiving and mixing module is used to receive the second radio signal, and the second radio signal is mixed with the first radio signal to generate the first mixed frequency signal; and an oscilloscope is connected to the receiving and mixing module for real-time Display the phase information of the first mixed frequency signal; wherein, the second radio signal is the echo signal generated by the transmitted signal or the target object reflecting the transmitted signal, and the oscilloscope is also used to obtain the phase information of the first mixed frequency signal when the phase shifter is adjusted phase change. The test device provided by the invention reduces the cost of measuring the phase offset of the phase shifter.

Description

technical field [0001] The invention relates to the technical field of phase shifter testing, in particular to a testing device and a testing method for a phase shifter. Background technique [0002] A phase shifter is an important component of a radio signal (such as radio frequency signal, microwave signal, etc.) transceiver system, which can be used to adjust the phase of an input radio signal. [0003] For the phase shifter of independent components, the traditional way is to connect the input and output ports of the phase shifter to the two ports of the vector network analyzer respectively, so as to obtain the phase shift of the phase shifter by measuring the scattering parameters between the ports. [0004] However, due to the high price, the above method of measuring the phase shift of the phase shifter is expensive and inconvenient to measure. Contents of the invention [0005] The invention provides a testing device and a testing method for a phase shifter. The t...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R25/04H04B17/00
CPCG01R25/04H04B17/00
Inventor 刘正东
Owner CALTERAH SEMICON TECH SHANGHAI CO LTD