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A kind of test method, test device and test equipment of solid-state hard disk ber

A test method and solid-state hard drive technology, applied in static memory, instruments, etc., can solve problems such as accurate evaluation, unfavorable solid-state hard drive quality, and inability to reflect BER indicators, and achieve an effect that is conducive to accurate evaluation and product quality

Active Publication Date: 2022-05-10
INSPUR SUZHOU INTELLIGENT TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, most SSD manufacturers generally directly use this index provided by Nand Flash manufacturers, but it cannot reflect the real BER index in the actual SSD application environment, which is not conducive to accurate evaluation of the quality of SSDs

Method used

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  • A kind of test method, test device and test equipment of solid-state hard disk ber
  • A kind of test method, test device and test equipment of solid-state hard disk ber
  • A kind of test method, test device and test equipment of solid-state hard disk ber

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Experimental program
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Embodiment Construction

[0044] The core of the present invention is to provide a solid-state hard disk BER testing method, testing device, testing equipment and computer-readable storage medium for testing the actual BER index of the solid-state hard disk.

[0045] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0046] figure 1 The flowchart of the testing method of the first solid-state hard disk BER provided for the embodiment of the present invention;

[0047] figure 2 A BER distribution diagram of a hard disk to be tested is provi...

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Abstract

The invention discloses a method for testing the BER of a solid-state hard disk. Firstly, the programming and rewriting of the physical block of the hard disk to be tested are performed for a predetermined number of times to simulate the actual operating environment of the hard disk to be tested, and then a writing operation is performed on the hard disk to be tested. After waiting for the BER index of the hard disk to be tested to become stable, perform a read operation on the hard disk to be tested to obtain the read data, and finally determine the BER test result of the hard disk to be tested according to the read data, thus obtaining the actual The BER index in the operating environment is conducive to the accurate evaluation of the quality of solid-state hard disk products. The invention also discloses a solid-state hard disk BER testing device, testing equipment and a computer-readable storage medium, which have the above beneficial effects.

Description

technical field [0001] The invention relates to the technical field of hard disk testing, in particular to a solid state hard disk BER testing method, testing device, testing equipment and a computer-readable storage medium. Background technique [0002] At present, most of the storage modules of SSDs on the market use Nand Flash particles. As time goes by, Nand Flash particles will have bit flip errors. BER is an indicator to measure this characteristic of Nand Flash. The full name of BER is Bit Error Rate, which means the error caused by Bit flipping due to the probability of NAND Flash particles. At present, most SSD manufacturers generally directly use this index provided by Nand Flash manufacturers, but it cannot reflect the real BER index in the actual SSD application environment, which is not conducive to accurate evaluation of the quality of SSDs. [0003] How to test the actual BER index of the solid state disk is a technical problem to be solved by those skilled i...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G11C29/56
CPCG11C29/56
Inventor 秦飞
Owner INSPUR SUZHOU INTELLIGENT TECH CO LTD