Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A design method for the multiplexing of single-color random anti-counterfeiting patterns and double-color anti-counterfeiting patterns based on metasurfaces

A design method and super-surface technology, applied in the field of micro-nano optics, can solve the problems of reduced anti-counterfeiting security, large area of ​​optical anti-counterfeiting labels, etc., and achieve the effects of improving anti-counterfeiting security, simple and compact structure, and light weight

Inactive Publication Date: 2021-01-01
WUHAN UNIV
View PDF9 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the current optical anti-counterfeiting label has a large area, is easy to find and obtain, and can be copied and imitated, which greatly reduces the security of anti-counterfeiting

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A design method for the multiplexing of single-color random anti-counterfeiting patterns and double-color anti-counterfeiting patterns based on metasurfaces
  • A design method for the multiplexing of single-color random anti-counterfeiting patterns and double-color anti-counterfeiting patterns based on metasurfaces
  • A design method for the multiplexing of single-color random anti-counterfeiting patterns and double-color anti-counterfeiting patterns based on metasurfaces

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0025] The present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0026] 1. Optimize the design of the nano-brick unit structure that can realize the function of the polarizer under two different working wavelengths.

[0027] In the following, the nano brick unit structure is a cuboid as an example for illustration. The length, width and height of the nano brick unit structure are all sub-wavelength.

[0028] Such as figure 1 As shown, the xyz rectangular coordinate system is established. The long side direction of the nano-brick unit structure represents the long axis, and the short side direction represents the short axis. Φ is the angle between the long axis of the nano-brick unit structure and the x-axis, that is, the nano-brick unit The orientation angle of the structure (Φ ranges from 0° to 180°), such as figure 1 shown.

[0029] The size parameters of the nano-brick unit structure are opt...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a design method for realizing multiplexing of a single-color random anti-counterfeiting pattern and a double-color anti-counterfeiting pattern based on a metasurface, in whicha random anti-counterfeiting pattern can be generated by rotating the metasurface under the condition that single-wavelength linear polarized light is incident. Under the condition that double-wavelength polarized light is incident, a double-color anti-counterfeiting pattern can be generated through a rotary polarization analyzer, and finally multiplexing of the single-color random anti-counterfeiting pattern and the double-color anti-counterfeiting pattern is achieved. The design method is ingenious, random selection of the anti-counterfeiting pattern and dual-wavelength implementation of thedouble-color anti-counterfeiting pattern improve the counterfeiting difficulty, so that the double-color anti-counterfeiting pattern is difficult to copy and imitate, and the anti-counterfeiting security is greatly improved. The metasurface structure is simple and compact, the size is small, the weight is light, the metasurface structure can be conveniently integrated to high-end chips, watches,diamond rings and other valuable commodities with the small size, and an anti-counterfeit label based on the design method is not prone to being perceived, obtained and counterfeited.

Description

technical field [0001] The invention relates to the field of micro-nano optics technology, and specifically refers to a design method based on a metasurface to realize the multiplexing of a single-color random anti-counterfeiting pattern and a double-color anti-counterfeiting pattern. Background technique [0002] The rapid development of modern science and technology and the increasing rampant of various counterfeit and shoddy activities have promoted the development of various anti-counterfeiting technologies. Among them, optical anti-counterfeiting is an important branch of anti-counterfeiting technology, which is widely used in all aspects of social life, especially in currency , securities, licenses, seals, medicine, food, cosmetics, clothing, agricultural products, automobile and agricultural machinery accessories, audio-visual products, software computer chips and other fields where there are many frauds and infringements, optical anti-counterfeiting technology is wide...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G09F3/02G02B1/00G02B27/00
CPCG02B1/002G02B27/0012G09F3/02
Inventor 郑国兴付娆李子乐单欣李仲阳
Owner WUHAN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products