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Method and device for measuring point spread function of microscope

A point spread function, microscope technology, used in geometric properties/aberration measurement, testing optical performance and other directions, can solve the problem of inability to accurately determine the objective lens spread function of the microscope

Pending Publication Date: 2020-05-15
SHANDONG UNIV OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] In view of this, the object of the present invention is to provide a method and device for measuring the point spread function of a microscope, so as to alleviate the technical problem that the point spread function corresponding to the objective lens of the microscope at each height cannot be accurately determined in the prior art

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  • Method and device for measuring point spread function of microscope
  • Method and device for measuring point spread function of microscope
  • Method and device for measuring point spread function of microscope

Examples

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Embodiment 1

[0027] According to an embodiment of the present invention, an embodiment of a method for measuring the point spread function of a microscope is provided. It should be noted that the steps shown in the flowcharts of the accompanying drawings can be executed in a computer system such as a set of computer-executable instructions , and, although a logical order is shown in the flowcharts, in some cases the steps shown or described may be performed in an order different from that shown or described herein.

[0028] figure 1 is a method according to an embodiment of the present invention, such as figure 1 As shown, the method includes the following steps:

[0029] Step S102, determining the first position coordinates of the fiber laser head, so that the first linearly polarized light enters the first detector, and the first detector detects that the unit direction vector of the first linearly polarized light is preset A unit direction vector, wherein the first linearly polarized ...

Embodiment 2

[0082] The embodiment of the present invention also provides a measuring device for the point spread function of the microscope, which is used to implement the measuring method for the point spread function of the microscope provided in the above content of the embodiment of the present invention, the following is the implementation of the present invention The example provides a detailed description of the microscope point spread function measurement setup.

[0083] Such as Figure 5 as shown, Figure 5 It is a schematic diagram of the measuring device of the above-mentioned microscope point spread function, and the measuring device of the microscope point spread function includes: a first determination unit 10 , an acquisition unit 20 , a second determination unit 30 and a third determination unit 40 .

[0084] The first determination unit 10 is configured to determine the first position coordinates of the fiber laser head, so that the first linearly polarized light enters ...

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Abstract

The invention provides a method and device for measuring a point spread function of a microscope, and relates to the technical field of optical microscopic measurement. The method comprises the stepsof determining first position coordinates of an optical fiber laser head so as to enable first linearly polarized light to enter a first detector, wherein the unit direction vector of the first linearly polarized light detected by the first detector is a preset unit direction vector; acquiring a second position coordinate group sent by a second detector, and acquiring a light spot image on an image plane of the microscope; based on the light spot image, the preset unit direction vector and the second position coordinate group, determining a microscopic magnification factor group of the microscope; and determining a point spread function group by combining a normalization function and the microscopic magnification factor group. The technical problem that the longitudinal object plane perpendicular to the optical axis of the microscope cannot be accurately determined in the existing microscope point spread function measurement technology is solved, and the measurement of the three-dimensional point spread function on the longitudinal object plane perpendicular to the optical axis of the microscope is realized.

Description

technical field [0001] The invention relates to the technical field of optical microscopic measurement, and mainly relates to a method and a device for measuring a point spread function of a microscope. Background technique [0002] After an ideal point light source passes through an optical system, the light field distribution of its image is called the point spread function (PSF) of the system. The point spread function describes the resolution ability of the optical system to point sources, and is the main parameter index for evaluating various microscopic imaging systems. Therefore, an accurate measurement of the point spread function of the system is indispensable. Generally, there are two ways to estimate the point spread function: numerical calculation and physical measurement. Numerical calculations usually use the theoretical point spread function model of the lens. Because the pupil function is difficult to estimate accurately, the theoretical model cannot reflec...

Claims

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Application Information

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IPC IPC(8): G01M11/02
CPCG01M11/0242
Inventor 毛帅王军涛
Owner SHANDONG UNIV OF TECH