Device operation neural network test method and device
A neural network and device-under-test technology, applied in the field of artificial intelligence, can solve the problems of high work complexity, low test efficiency, huge amount of data, etc., and achieve the effect of reducing labor load, improving test efficiency and high accuracy
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[0030] Embodiments of the present application will be described in detail below in conjunction with the accompanying drawings. It should be noted that, in the case of no conflict, various embodiments in the present application and various features therein can be combined arbitrarily with each other.
[0031] As mentioned earlier, after installing a neural network into hardware (e.g., a dedicated chip), it is necessary to test how well the hardware containing the neural network performs the neural network operations (e.g., whether the results are correct, whether the accuracy is as expected, etc.) . In the process of testing the condition of the neural network running on the hardware, it is necessary to manually construct test data such as image data, parameter data, and instructions related to the neural network, and manually prepare the expected calculation results. The data volume is huge and the work complexity High, the test efficiency is very low.
[0032] Regarding the...
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