A Tire X-ray Flaw Detection Method Based on Reranking Using Background Features
A defect detection and defect technology, applied in the field of computer vision and industrial inspection, can solve problems such as affecting traffic and driving safety, high production requirements, bubbles, etc., to avoid inefficiency, increase probability, and increase robustness.
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[0036] The implementation of the present application will be described in detail below with reference to the accompanying drawings and examples, so as to fully understand and implement the implementation process of how the present application uses technical means to solve technical problems and achieve technical effects.
[0037] refer to Figure 1-2 , the purpose of this example is to realize the defect detection of tire X-ray images according to the present invention. The process of the method includes steps such as data collection, image preprocessing, model training, and background feature re-ranking for defect detection, such as image 3 As shown, the specific implementation process diagram is as follows:
[0038] Step (1): Data collection. In this example, a total of 10,919 defect pictures are marked, and each defect picture marks the location and type of all defects. The types are marked in the form of 0, 1, 3, ..., 5, and the specific types are shown in Table 1. This...
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