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Semiconductor memory test data storage method and device
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Al technical title is built by PatSnap Al team. It summarizes the technical point description of the patent document.
A memory testing, semiconductor technology, applied in static memory, instruments, etc., can solve the problems of complex implementation and difficult search.
Active Publication Date: 2020-05-19
武汉精鸿电子技术有限公司
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[0005] In view of this, the present invention provides a semiconductor memory test data storage method and device, to solve or at least partially solve the technical problems of complex implementation and difficult search in the prior art
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Embodiment 1
[0062] This embodiment provides a storage method for semiconductor memory test data, please refer to figure 1 , the storage methods include:
[0063] S101: Comparing the data written into the data block of the semiconductor memory chip with the actual data, and judging existing bad blocks according to the comparison.
[0064] Specifically, see figure 2 , is a structural schematic diagram of a semiconductor chip Nand chip, a semiconductor memory chip is a chip test unit DUT, a chip test unit includes a plurality of chip selection blocks CE, a chip selection block includes a plurality of block blocks, and a block includes a plurality of Page page, a page includes multiple data block chunks, and a data block includes multiple bytes. According to the structure of the chip, the chip test unit DUT, chip selection block CE, block block, page page, and data block chunk can be mapped. Through this correspondence, the chip selection block CE and block block in the chip test unit can ...
Embodiment 2
[0128] Based on the same inventive concept, this embodiment also provides a storage device for semiconductor memory test data, a semiconductor memory chip is a chip test unit, a chip test unit includes a plurality of chip selection blocks, and a chip selection block includes a plurality of blocks , a block includes multiple pages, a page includes multiple data blocks, and a data block includes multiple bytes, see Figure 9 , the storage device consists of:
[0129] The judging module 201 is used for comparing the data written into the data block of the semiconductor memory chip with the actual data, and judging the existing bad blocks according to the comparison;
[0130] The bad block management module 202 is used to number and count the bad blocks, and store the bad block information, wherein the bad block information includes the bad block number, the chip selection block corresponding to the bad block number, and the chip test corresponding to the bad block number Units a...
Embodiment 3
[0165] See Figure 10 , this embodiment provides a computer-readable storage medium, on which a computer program is stored, and when the program is executed, implements the method described in one.
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Abstract
The invention discloses a semiconductor memory test data storage method and device. The method comprises the steps: comparing data written into a semiconductormemory chip data block with actual data,and judging an existing bad block according to the comparison condition; numbering and counting bad blocks, and storing bad block information; comparing the data written into the data block with theactual data, recording the compared data block information, and storing the data block information; setting a corresponding relationship between the bad block information and the data block information; and positioning the data block information corresponding to the bad block according to the corresponding relationship between the bad block information and the data block information. According tothe invention, the test data can be conveniently stored, the storage mode is simple, and the corresponding test result information can be conveniently and quickly found.
Description
technical field [0001] The invention relates to the technical field of data storage and analysis, in particular to a method and device for storing test data of a semiconductor memory. Background technique [0002] Semiconductor memory is an important component of modern digital systems, especially computer systems. With the increasing integration of semiconductor memory, the size of semiconductor device particles is getting smaller and smaller, and the failure rate of semiconductor devices is also increasing. The test data of the memory is also increasing. [0003] In the process of implementing the present invention, the inventor of the present application found that the method of the prior art has at least the following technical problems: [0004] In the prior art, test engineers generally back up test data. The existing storage method is relatively complicated, and it takes a lot of time to read the required test data, which is not conducive to data search. Contents o...
Claims
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